Acquistion of a Field-Emission Analytical Electron Microscpoe

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This award provides funds to upgrade a scanning transmission microscope with a field-emission gun which will be used for materials research. The State of New Jersey has provided funds to purchase a conventional Scanning Transmission Electron Microscope. This award allows for the purchase of a substantially upgraded, newly developed Field Emission Gun-Scanning Transmission Electron Microscope with advanced capability. %%% The instrument will be located at Stevens Institute of Technology in a new microscopy facility being developed with state funds, and available through a consortia of 5 institutions in the New Jersey area, the Advanced Technology Center for Surface Engineered Materials. Consortia institutions include: New Jersey Institute of Technology, Princeton University, Rutgers University, Stevens Institute of Technology, and David Sarnoff Research Center. The consortia was created to study surface and thin-film materials problems and is headed by Dr. Bernard Kear, at Rutgers. The Center at Stevens focusses on materials research problems related to surfaces and thin films such as: interfaces in nanophase ceramics, ceramic/intermetallic matrix composites, optoelectronic thin film crystallization, and buffered superconducting thin films. The instrument will be available to members of the center and others from local universities and industries.