Scattering and Recoiling Imaging Spectrometry (SARIS) for Surface Composition, Structure, and Dynamics

休斯敦大学J. Wayne Rabalais教授的实验室研究了一种实时确定固体表面结构和组成的方法，并以空间分辨的方式进行了研究。分析和表面化学项目为固体表面的散射和反冲成像光谱（SARIS）的实时分析研究提供了支持。建模和解释方法的发展是目前研究的重点，并广泛应用于表面分析和薄膜生长问题。预计不久将完成一种用于SARIS研究的新仪器，在材料科学的几个领域的应用是本研究项目工作的重点。关于固体表面结构和组成的实时、空间分辨信息对于理解从半导体器件制造到多相催化等一系列重要技术问题至关重要。离子散射光谱法是一种用于固体表面实时空间分辨分析的方法。本研究结合了仪器开发，实验结果解释的计算模型，并应用于各种重要的表面分析问题，以提供具有重要技术意义的广泛项目。这种方法在电子材料分析中的重要应用是可以预期的。

A method for the determination of the structure and composition of solid surfaces in real time and in a spatially resolved manner is the subject of this research project in the laboratory of Professor J. Wayne Rabalais at the University of Houston. The Analytical and Surface Chemistry Program provides support for these studies of scattering and recoiling imaging spectrometry (SARIS) for the real time analysis of solid surfaces. Development of modelling and interpretive methodology is a focus of the present research, and application to a wide range of surface analysis and thin film growth problems is being carried out. Completion of a new instrument for SARIS studies is expected shortly, and applications in several areas of materials science form the focus of the work of this research project. Real time, spatially resolved information about the structure and composition of solid surfaces is crucial to the understanding of a very wide range of important technological problems, ranging from semiconductor device fabrication to heterogeneous catalysis. Ion scattering spectrometry is being developed as a method for the real time spatially resolved analysis of solid surfaces. This research combines instrumental development, calculational modelling for the interpretation of experimental results, and application to a wide variety of important surface analysis problems to provide a wide ranging project of significant technical import. Significant applications of this methodology in the analysis of electronic materials are to be expected.