SREDS - Scattering and Recoiling for Electron Distributions and Structure

这个项目是在分析和表面化学的一般领域和在离子束/固体表面相互作用的子领域。一种新的仪器技术将从飞行时间的分析散射和反冲中性和/或离子的固体表面轰击0.1 - 5.0千电子伏特能量的离子。这种技术可以在一次实验中测定表面原子结构和电子密度分布。要研究的系统包括金属、半导体、无机盐和氧化物的清洁和吸附表面。这种新的表面分析技术的灵敏度是传统离子散射光谱法的100到1000倍，具有高度的表面灵敏度（两个原子层），可以探测到氢等轻元素。它将显著地扩展表面化学和物理的现有知识。

This project is in the general field of analytical and surface chemistry and in the subfield of ion beam/solid surface interactions. A new instrumental technique will be developed from time of flight analysis of scattered and recoiled neutral and/or ionic species from a solid surface bombarded with ions of 0.1 - 5.0 kiloelectron volt energies. This technique will permit determination of surface atomic structure and electron density distributions in a single experiment. Systems to be investigated include clean and adsorbate covered surfaces of metals, semiconductors, and inorganic salts and oxides. This new surface analytical technique is 100 to 1000 times more sensitive than conventional ion scattering spectrometries, is highly surface sensitive (two atomic layers) and can detect light elements such as hydrogen. It will markedly extend current knowledge of the chemistry and physics of surfaces.