SREDS - Scattering and Recoiling for Electron Distributions and Structure

该项目涉及分析和表面化学的一般领域，以及离子束/固体表面相互作用的子领域。从0.1-5.0千电子伏能离子轰击固体表面的散射和反冲中性和/或离子物种的飞行时间分析中，将开发一种新的仪器技术。这项技术将允许在一次实验中确定表面原子结构和电子密度分布。要研究的系统包括金属、半导体、无机盐和氧化物的清洁和吸附表面。这种新的表面分析技术比传统的离子散射光谱仪灵敏度高100到1000倍，具有高度的表面敏感性(两个原子层)，并且可以检测到氢等轻元素。它将极大地扩展目前关于表面化学和物理的知识。

This project is in the general field of analytical and surface chemistry and in the subfield of ion beam/solid surface interactions. A new instrumental technique will be developed from time of flight analysis of scattered and recoiled neutral and/or ionic species from a solid surface bombarded with ions of 0.1 - 5.0 kiloelectron volt energies. This technique will permit determination of surface atomic structure and electron density distributions in a single experiment. Systems to be investigated include clean and adsorbate covered surfaces of metals, semiconductors, and inorganic salts and oxides. This new surface analytical technique is 100 to 1000 times more sensitive than conventional ion scattering spectrometries, is highly surface sensitive (two atomic layers) and can detect light elements such as hydrogen. It will markedly extend current knowledge of the chemistry and physics of surfaces.