SREDS - Scattering and Recoiling for Electron Distributions and Structure

该项目是在一般领域的分析和表面 离子束/固体表面 交互. 将开发一种新的仪器技术 从飞行时间分析散射和反冲中性 和/或离子物质 0.1 - 5.0千电子伏的能量。 这种技术将 允许测定表面原子结构和电子 密度分布在一个单一的实验。 系统被 研究包括清洁和吸附物覆盖的表面， 金属、半导体、无机盐和氧化物。 这种新的表面分析技术要高出100到1000倍 比传统的离子散射光谱法灵敏， 高度表面敏感（两个原子层），可检测 轻元素，如氢。 它将显著延长 表面化学和物理学的最新知识。

This project is in the general field of analytical and surface chemistry and in the subfield of ion beam/solid surface interactions. A new instrumental technique will be developed from time of flight analysis of scattered and recoiled neutral and/or ionic species from a solid surface bombarded with ions of 0.1 - 5.0 kiloelectron volt energies. This technique will permit determination of surface atomic structure and electron density distributions in a single experiment. Systems to be investigated include clean and adsorbate covered surfaces of metals, semiconductors, and inorganic salts and oxides. This new surface analytical technique is 100 to 1000 times more sensitive than conventional ion scattering spectrometries, is highly surface sensitive (two atomic layers) and can detect light elements such as hydrogen. It will markedly extend current knowledge of the chemistry and physics of surfaces.