SREDS - Scattering and Recoiling for Electron Distributions and Structure

SREDS - 电子分布和结构的散射和反冲

• 批准号: 8814337
• 负责人: John Rabalais
• 金额: $ 58.98万
• 依托单位: University of Houston
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 1989
• 资助国家: 美国
• 起止时间: 1989-03-15 至 1995-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=8814337&HistoricalAwards=false
• 关键词: SREDS; Scattering; Recoiling; Electron; Distributions

This project is in the general field of analytical and surface chemistry and in the subfield of ion beam/solid surface interactions. A new instrumental technique will be developed from time of flight analysis of scattered and recoiled neutral and/or ionic species from a solid surface bombarded with ions of 0.1 - 5.0 kiloelectron volt energies. This technique will permit determination of surface atomic structure and electron density distributions in a single experiment. Systems to be investigated include clean and adsorbate covered surfaces of metals, semiconductors, and inorganic salts and oxides. This new surface analytical technique is 100 to 1000 times more sensitive than conventional ion scattering spectrometries, is highly surface sensitive (two atomic layers) and can detect light elements such as hydrogen. It will markedly extend current knowledge of the chemistry and physics of surfaces.

该项目属于分析和表面化学的一般领域以及离子束/固体表面相互作用的子领域。 一种新的仪器技术将通过对来自用 0.1 - 5.0 千电子伏特能量的离子轰击的固体表面的散射和反冲中性和/或离子物质的飞行时间分析来开发。 该技术将允许在单个实验中确定表面原子结构和电子密度分布。 要研究的系统包括金属、半导体、无机盐和氧化物的清洁和吸附剂覆盖的表面。 这种新的表面分析技术比传统离子散射光谱法的灵敏度高 100 至 1000 倍，具有高度表面敏感性（两个原子层），并且可以检测氢等轻元素。 它将显着扩展当前表面化学和物理学的知识。