Ion/Atom/Electron Surface Dynamics Using Experimental Coincidence-Correlation Techniques and Theoretical Analysis

使用实验符合相关技术和理论分析的离子/原子/电子表面动力学

• 批准号: 0608851
• 负责人: John Rabalais
• 金额: $ 48万
• 依托单位: University of Houston
• 依托单位国家: 美国
• 项目类别: Continuing Grant
• 财政年份: 2006
• 资助国家: 美国
• 起止时间: 2006-09-01 至 2010-08-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0608851&HistoricalAwards=false
• 关键词: Ion; Atom; Electron; Surface; Dynamics

AbstractCHE-0608851Rabalais/HoustonProfessor Rabalais at the University of Houston, in collaboration with Professor Bahrim at Lamar University, is developing ion surface scattering analytical methods for the detailed structural and compositional analysis of surfaces. With the support of the Analytical and Surface Chemistry Program, this team is developing experimental and computational methods focused on ion-electron coincidence and correlation in ion scattering spectrometry. Electron wave packet propagation analysis, combined with detailed coincidence spectra, is used to develop a charge transfer microscopy for the analysis of surfaces. The broader impact of this work lies in the fact that these methods are useful in the semiconductor process industry as well as broadly in the analysis of technological surfaces in catalysis and corrosion applications. Rabalais and coworkers are using electron-ion coincidence spectroscopy, coupled with detailed theoretical analysis, to develop methods for the structural and compositional analysis of surfaces. This unique approach provides a new level of detail about the ion-surface scattering process, and enables a new level of structural and compositional information to be obtained. This fundamental mechanistic information about ion-surface scattering finds application in a number of industrial settings, ranging from semiconductor processing to heterogeneous catalysis.

Rabalais/ houstonhouston大学的Rabalais教授与Lamar大学的Bahrim教授合作，正在开发离子表面散射分析方法，用于表面的详细结构和成分分析。在分析和表面化学项目的支持下，该团队正在开发实验和计算方法，重点关注离子散射光谱中的离子-电子重合和相关性。电子波包传播分析，结合详细的符合谱，被用于发展电荷转移显微镜的表面分析。这项工作更广泛的影响在于，这些方法在半导体加工工业中很有用，在催化和腐蚀应用的技术表面分析中也很广泛。Rabalais和他的同事正在使用电子-离子重合光谱学，结合详细的理论分析，开发表面结构和成分分析的方法。这种独特的方法为离子表面散射过程提供了一个新的细节水平，并使结构和成分信息能够获得一个新的水平。这种关于离子表面散射的基本机制信息在许多工业环境中都有应用，从半导体加工到多相催化。