Acquisition of a Multi-User XPS System to Investigate Materials and Environmental Chemistry

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With this award from the Major Research Instrumentation (MRI) Program, the Department of Chemistry at the University of Iowa will acquire an X-ray photoelectron spectrometer. This equipment will enhance research in a number of areas: a) novel synthetic methods for patterning silicon surfaces; b) design of molecular precursor routes to inorganic materials; c) surface characterization of atmospheric particulates; and d) characterization of iron surfaces in environmental applications. The X-ray photoelectron spectrometer (XPS) is used for chemical analysis. It irradiates a sample with a beam of monochromatic X-rays and the energies of the resulting photoelectrons are measured and related to specific elements. XPS often plays a crucial role in defining the system under study. The work to be carried out by these investigators represents a highly coherent attack on a range of issues at the forefront of materials chemistry and environmental chemistry.