SHF: Small: Achieving IC Quality through On-Going Diagnosis and Customized Test

提案ID: 0916828 PI名称：Blanton Shawn机构：卡内基梅隆大学标题：通过持续诊断和定制测试实现IC质量计算机芯片测试的主要目标一直是并将继续是将好芯片与坏芯片（即不符合预期操作特性的芯片）分离开来。然而，测试现在正被扩展为一项增值工作。在这个项目中，我们对测试数据进行数据挖掘，以便持续监控芯片质量。我们建议使用芯片故障的诊断提取模型以及一种评估芯片质量的新技术。两者都被纳入在线质量监测方法，通过改变应用于计算机芯片的实际测试，以更好地匹配当前失效芯片的特性，确保达到所需的质量水平。这种质量方法本质上是动态的，是对典型方法的根本改变。毫无例外，每个芯片制造商（Intel， IBM等）都认为任何类型的缺陷都可能出现在芯片的任何地方，这意味着每个制造的实例都必须以相当大的代价进行彻底的测试。这类似于在没有进行一次诊断检查的情况下为每个病人开出所有可能的疾病/疾病的药物。与传统方法相反，这项提议的工作取代了过去无法确定哪些疾病的芯片。（即，缺陷）实际上发生在制造的集成电路中。处方?因此，可以改变和/或减少对芯片进行的测试，以匹配发现的疾病，而不是像现在这样进行过度测试，从而以最小的成本提高芯片质量。

Proposal ID: 0916828 PI name: Blanton Shawn Institution: Carnegie-Mellon University Title: Achieving IC Quality through On-Going Diagnosis and Customized TestABSTRACTThe main objective of computer chip testing has and continues to be the separation of good chips from bad ones (i.e., ones that do not meet the desired operational characteristics). Test is now however being expanded as a value-added endeavor. In this project, we are data-mining test data in order to continuously monitor chip quality. We propose to use diagnosis-extracted models of chip failures along with a new technique for estimating chip quality. Both are incorporated in an on-line, quality-monitoring methodology that ensures a desired level of quality by changing the actual tests applied to a computer chip to better match the characteristics of currently-failing chips.This approach to quality is dynamic in nature and is a radical change from the typical approach. Without exception, each chip manufacturer (Intel, IBM, etc.) assumes that any type of defect can occur anywhere within their chip which means that each manufactured instance has to be thoroughly tested at considerable expense. This is akin to prescribing drugs for all possible diseases/ailments for every patient without performing one diagnostic examination. Opposed to the traditional approach, this proposed work instead diagnoses chips that have failed in the past to determine what ?diseases? (i.e., defects) actually are occurring within the fabricated ICs. The ?prescriptions? (i.e., the tests applied to the chips) can therefore be changed and/or minimized to match the diseases found instead of over-testing as is done now, leading to improved chip quality at minimal cost.