CRIF-MU: Acquisition of an X-Ray photoelectron spectrometer (XPS) for small area and depth profiling analysis

CRIF-MU：购买 X 射线光电子能谱仪 (XPS)，用于小面积和深度剖面分析

• 批准号: 1048740
• 负责人: Luis Colon
• 金额: $ 45万
• 依托单位: SUNY at Buffalo
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2010
• 资助国家: 美国
• 起止时间: 2010-12-15 至 2013-11-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1048740&HistoricalAwards=false
• 关键词: CRIF; MU; Acquisition; Ray; photoelectron

With this award from the Chemistry Research Instrumentation and Facilities: Multi-user (CRIF:MU) program, Professor Luis Colon and colleagues Sarbajit Banerjee, Frank Bright, Joseph Gardella and David Watson from SUNY Buffalo will acquire an X-ray photoelectron spectrometer (XPS). The award will enhance research training and education at all levels, especially in areas of study such as (a) surface aggregation and reorganization of polymeric materials, (b) correlation of electronic structure of nanomaterials to finite size effects on material properties, (b) protein behavior dynamics in restricted microenvironments, (c) fundamental studies of silica imprinted nanostructures, and (d) linked-assisted materials assembly that have quantum dots.X-ray photoelectron spectrometers are used for chemical analysis. The XPS technique quantitatively measures elemental composition, empirical formula, chemical state and electronic state of the elements in a given material. A sample is irradiated with a beam of monochromatic X-rays and the kinetic energies of the resulting photoelectrons are measured and related to specific elements. XPS often plays a crucial role in defining the system under study. The technique requires the use of ultra high vacuum conditions. The work to be carried out by these investigators represents a wide array of systems requiring surface characterization. The instrumentation will be used in research activities and also for research training and education of a large number of students from diverse backgrounds.

凭借化学研究仪器和设施：多用户（CRIF：MU）计划的这一奖项，来自纽约州立大学布法罗的Luis Colon教授和同事Sarbajit Banerjee，Frank Bright，Joseph Gardella和大卫沃森将获得X射线光电子能谱仪（XPS）。该奖项将加强各级的研究培训和教育，特别是在以下研究领域：（a）聚合物材料的表面聚集和重组，（B）纳米材料的电子结构与有限尺寸对材料性能的影响的相关性，（B）受限微环境中的蛋白质行为动力学，（c）二氧化硅印迹纳米结构的基础研究，以及（d）具有量子点的连接辅助材料组件。X射线光电子能谱仪用于化学分析。XPS技术定量测量给定材料中元素的元素组成、经验式、化学状态和电子状态。用一束单色X射线照射样品，测量产生的光电子的动能，并将其与特定元素联系起来。XPS通常在定义所研究的系统方面起着至关重要的作用。该技术需要使用超高真空条件。这些研究人员将要开展的工作代表了一系列需要表面表征的系统。该仪器将用于研究活动，也用于研究培训和来自不同背景的大量学生的教育。