SHF: Small: Collaborative Research: Unified Framework for Adaptive Analog and Digital Performance Characterization Using Learned Information from the Circuit Under Test

SHF：小型：协作研究：使用从被测电路中学到的信息进行自适应模拟和数字性能表征的统一框架

• 批准号: 1116786
• 负责人: Linda Milor
• 金额: $ 20万
• 依托单位: Georgia Tech Research Corporation
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2011
• 资助国家: 美国
• 起止时间: 2011-07-01 至 2015-10-31
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1116786&HistoricalAwards=false
• 关键词: SHF; Small; Collaborative; Research; Unified

As semiconductor technology scales to make smaller circuits in order to reduce circuit fabrication costs, a by-product is that it is very hard to make circuit components that match specifications exactly. Displacement of a single atom can make the circuit behave differently. The diversity of devices being produced from the same process with the same design makes it un-economical to test them with a "one size fits all" test program. Because each component is unique, we also need a test strategy that is fine-tuned to the circuit being tested. The proposed work involves adjusting the test program to devices under test iteratively as we gather information about each device throughout the testing process. Keeping a leading edge in information technology is essential for the economical and social well being of the nation. Our most advanced technologies produce statistically diverse devices from the same design and manufacturing specification. Future technologies will produce even more diverse devices. Thorough testing of these increasingly complex devices is a key component in maintaining an edge in information technology. This project will explore new testing methodologies by developing methods to enable a shift from static to dynamic test procedures. In addition, this project will pilot a set of undergraduate design projects involving collaboration between Georgia Tech and Arizona State to mimic the prevalent need to collaborate over long distances in industry.

为了降低电路制造成本，半导体技术不断缩小电路的尺寸，其附带的后果是很难制造出完全符合规格的电路元件。单个原子的位移可以使电路的行为不同。由同一工艺生产的具有相同设计的设备的多样性使得用“一刀切”的测试程序进行测试是不经济的。因为每个组件都是独特的，我们还需要一个测试策略，以微调被测试的电路。建议的工作包括在整个测试过程中收集有关每个设备的信息时，迭代地调整测试程序以适应测试设备。保持资讯科技的领先地位，对国家的经济和社会福祉至关重要。我们最先进的技术从相同的设计和制造规范生产统计上不同的设备。未来的技术将生产出更加多样化的设备。对这些日益复杂的设备进行彻底测试是保持信息技术优势的关键组成部分。这个项目将通过开发方法来探索新的测试方法，从而实现从静态测试过程到动态测试过程的转变。此外，该项目将试点一系列本科设计项目，涉及佐治亚理工学院和亚利桑那州立大学之间的合作，以模拟工业中长距离合作的普遍需求。