SHF:Medium:Collaborative Research: AgeELESS: Aging Estimation and Lifetime Enhancement in Silicon Systems
SHF:中:合作研究:AgeELESS:硅系统中的老化估计和寿命增强
基本信息
- 批准号:1161332
- 负责人:
- 金额:$ 28万
- 依托单位:
- 依托单位国家:美国
- 项目类别:Continuing Grant
- 财政年份:2012
- 资助国家:美国
- 起止时间:2012-05-01 至 2017-04-30
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
As CMOS technologies scale down to smaller geometries, integrated circuits become more sensitive to aging-driven variations. Such variations can cause a manufactured part to become unreliable in the field over a period of time due to aging-induced circuit failures. To guard against this problem, it is essential to build design-time and run-time techniques that can model and optimize CMOS circuits. The AgELESS project brings together expertise in circuit design, computer-aided design, and test techniques, which together are expected to provide a more complete set of solutions to the overcome the reliability hurdle. This work explores several major aging-related failures, and develops a toolbox of techniques that can be used to enhance circuit reliability, while ensuring that the circuit meets all specifications on power/energy and performance. While AgELESS will not make a circuit ageless, it is expected to ensure that it will age less. The techniques developed in this research will be applicable to a range of applications of interest to the semiconductor industry, including enterprise-class for high-end computing systems, mobile and wireless communication applications, and embedded electronics, and will be made available to industry through multiple avenues, including industrial collaborations and active dissemination of research results. The educational impact of this project will involve new course materials on reliability for the undergraduate and graduate curriculum, and will train future scientists/engineers to learn creative problem-solving skills.
随着CMOS技术缩小到更小的几何尺寸,集成电路对老化驱动的变化变得更加敏感。由于老化引起的电路故障,这种变化可能导致制造的部件在一段时间内变得不可靠。为了防止这个问题,必须建立设计时和运行时技术,可以建模和优化CMOS电路。AgELESS项目汇集了电路设计、计算机辅助设计和测试技术方面的专业知识,有望为克服可靠性障碍提供一套更完整的解决方案。这项工作探讨了几个主要的与老化相关的故障,并开发了一个技术工具箱,可用于提高电路的可靠性,同时确保电路符合功率/能量和性能的所有规格。虽然不老不会使电路不老,但它有望确保电路不会老化。本研究开发的技术将适用于半导体行业的一系列应用,包括高端计算系统的企业级应用、移动和无线通信应用以及嵌入式电子产品,并将通过多种途径向行业提供,包括工业合作和积极传播研究成果。该项目的教育影响将包括为本科和研究生课程提供关于可靠性的新课程材料,并将培训未来的科学家/工程师学习创造性解决问题的技能。
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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Subhasish Mitra其他文献
Dendrite-inspired Computing to Improve Resilience of Neural Networks to Faults in Emerging Memory Technologies
树突启发计算可提高神经网络对新兴内存技术故障的恢复能力
- DOI:
- 发表时间:
2023 - 期刊:
- 影响因子:0
- 作者:
L. K. John;F. M. G. França;Subhasish Mitra;Zachary Susskind;P. M. V. Lima;Igor D. S. Miranda;E. B. John;Diego L. C. Dutra;M. Breternitz - 通讯作者:
M. Breternitz
Segregation of a Phosphorus Rich Phase During Differential Solidification of BOF Slag
- DOI:
10.1007/s11663-022-02586-3 - 发表时间:
2022-07-06 - 期刊:
- 影响因子:3.100
- 作者:
Thi Bang Tuyen Nguyen;Subhasish Mitra;Geoffrey M. Evans;Hamid Doostmohammadi;Brian J. Monaghan;Paul Zulli;Kyoung-oh Jang;Damien O’Dea;Tom Honeyands - 通讯作者:
Tom Honeyands
Measurement of gas dispersion parameters in a reflux flotation cell
回流浮选槽中气体分散参数的测量
- DOI:
10.1016/j.mineng.2025.109526 - 发表时间:
2025-10-01 - 期刊:
- 影响因子:5.000
- 作者:
Abdullaziz Glabe Zakari;Raju Chowdhury;Peter Ireland;Geoffrey Evans;Subhasish Mitra - 通讯作者:
Subhasish Mitra
Effect of bubble surface loading on bubble rise velocity
- DOI:
10.1016/j.mineng.2021.107252 - 发表时间:
2021-12-01 - 期刊:
- 影响因子:
- 作者:
Ai Wang;Mohammad Mainul Hoque;Roberto Moreno-Atanasio;Elham Doroodchi;Geoffrey Evans;Subhasish Mitra - 通讯作者:
Subhasish Mitra
Cooling future system-on-chips with diamond inter-tiers
使用金刚石中间层冷却未来片上系统
- DOI:
- 发表时间:
2023 - 期刊:
- 影响因子:8.9
- 作者:
M. Malakoutian;Anna Kasperovich;Dennis Rich;Kelly Woo;Christopher Perez;R. Soman;Devansh Saraswat;Jeong;Maliha Noshin;Michelle Chen;Sam Vaziri;Xinyu Bao;Che Chi Shih;W. Woon;M. Asheghi;Kenneth E. Goodson;S. Liao;Subhasish Mitra;Srabanti Chowdhury - 通讯作者:
Srabanti Chowdhury
Subhasish Mitra的其他文献
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{{ truncateString('Subhasish Mitra', 18)}}的其他基金
Collaborative Research: SHF: Small: Quasi Weightless Neural Networks for Energy-Efficient Machine Learning on the Edge
合作研究:SHF:小型:用于边缘节能机器学习的准失重神经网络
- 批准号:
2326895 - 财政年份:2023
- 资助金额:
$ 28万 - 项目类别:
Standard Grant
FuSe-TG: The Future of Semiconductor Technologies for Computing through Device-Architecture-Application Co-Design
FuSe-TG:通过设备-架构-应用协同设计进行计算的半导体技术的未来
- 批准号:
2235329 - 财政年份:2023
- 资助金额:
$ 28万 - 项目类别:
Standard Grant
E2CDA: Type I: Collaborative Research: Energy Efficient Learning Machines (ENIGMA)
E2CDA:类型 I:协作研究:节能学习机 (ENIGMA)
- 批准号:
1640078 - 财政年份:2016
- 资助金额:
$ 28万 - 项目类别:
Continuing Grant
Collaborative Research: Visual Cortex on Silicon
合作研究:硅上视觉皮层
- 批准号:
1317470 - 财政年份:2013
- 资助金额:
$ 28万 - 项目类别:
Continuing Grant
Workshop: Bugs and Defects in Electronic Systems: The Next Frontier
研讨会:电子系统中的错误和缺陷:下一个前沿
- 批准号:
1341270 - 财政年份:2013
- 资助金额:
$ 28万 - 项目类别:
Standard Grant
II-NEW: Robust Carbon Nanotube Technology for Energy-Efficient Computing Systems: A Processing and Design Infrastructure for Emerging Nanotechnologies
II-新:用于节能计算系统的稳健碳纳米管技术:新兴纳米技术的处理和设计基础设施
- 批准号:
1059020 - 财政年份:2011
- 资助金额:
$ 28万 - 项目类别:
Standard Grant
Collaborative Research: Variability-Aware Software for Efficient Computing with Nanoscale Devices
协作研究:利用纳米级设备进行高效计算的可变性感知软件
- 批准号:
1028831 - 财政年份:2010
- 资助金额:
$ 28万 - 项目类别:
Continuing Grant
Collaborative Research: Globally Optimized Robust Systems on Multi-Core Hardware
协作研究:多核硬件上的全局优化鲁棒系统
- 批准号:
0903459 - 财政年份:2009
- 资助金额:
$ 28万 - 项目类别:
Standard Grant
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合作研究:不完美免疫碳纳米管场效应晶体管电路的设计、建模、自动化和实验
- 批准号:
0702343 - 财政年份:2007
- 资助金额:
$ 28万 - 项目类别:
Standard Grant
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