MRI: Development of Engineering testbed: Universal chip scale photonic testing instrument (UCPTI)

MRI：工程测试台开发：通用芯片级光子测试仪器（UCPTI）

• 批准号: 1229677
• 负责人: Yeshaiahu Fainman
• 金额: $ 106万
• 依托单位: University of California-San Diego
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2012
• 资助国家: 美国
• 起止时间: 2012-10-01 至 2015-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1229677&HistoricalAwards=false
• 关键词: MRI; Development; Engineering; testbed; Universal

The objective of this research is to develop a state-of-the-art photonic chip-scale probing solution for integrated Si-photonics testing and to enable new multidisciplinary collaborative projects in nano-photonics and opto-electronics. The approach exploits a universal electronic-photonic probing station that integrates electrical, optical far-field, and optical near-field probes for electrical and optical interfacing to integrated circuits and to individual elements within such circuits, together with a full set of external optical and electronic instrumentation to provide an affordable, zero-capital-investment testing capability for Research and Development by academic, industry and government laboratories.The intellectual merit of this versatile and user friendly Si-Photonics testing instrument includes basic research to identify new phenomena, inventing new photonic technology and creating new applications, as well as providing tremendous benefit to small businesses, various research institutions and government laboratories in their product development efforts. Moreover, it can serve as a testbed for development and reduction to practice of new approaches for efficiently probing and testing Si-photonic chips, gradually evolving to become industry standards.The broader impact of the instrument spans multiple fields, including information systems, high speed electronics and photonics, and future computer science and engineering to create wealth for 21st century economy by advancing integration of nanoscale photonic, electronic and biomedical science and technology. It will provide service to industry in Southern California and play a significant role in the education and development of human resources in science and engineering at the graduate and undergraduate levels helping to train future engineers.

本研究的目标是开发一种最先进的光子芯片级探测解决方案，用于集成Si光子学测试，并实现纳米光子学和光电子学的新多学科合作项目。该方法利用了一个通用的电子-光子探测站，该探测站集成了电、光远场和光近场探测器，用于与集成电路和这种电路内的各个元件进行电和光接口，以及全套外部光学和电子仪器，为学术界的研究和开发提供负担得起的零资本投资测试能力，这款多功能且用户友好的硅光子测试仪器的智力优势包括识别新现象的基础研究，发明新的光子技术和创造新的应用，以及为小型企业，各种研究机构和政府实验室的产品开发工作提供巨大的利益。此外，它还可以作为一个试验平台，用于开发和实践有效探测和测试硅光子芯片的新方法，并逐渐发展成为行业标准。该仪器的广泛影响跨越多个领域，包括信息系统，高速电子和光子学，以及未来的计算机科学和工程，通过推进纳米光子集成，为21世纪经济创造财富。电子和生物医学科学与技术。 它将为南加州的工业提供服务，并在研究生和本科生层次的科学和工程人力资源的教育和开发方面发挥重要作用，帮助培养未来的工程师。