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Multidimensional analysis of nanoparticulate structures using analytical ultracentrifugation with integrated multiwavelength detection

使用分析超速离心和集成多波长检测对纳米颗粒结构进行多维分析

基本信息

批准号：
252474060
负责人：
Professor Dr.-Ing. Wolfgang Peukert
金额：
--
依托单位：
Lehrstuhl für Feststoff- und Grenzflächenverfahrenstechnik (LFG)
依托单位国家：
德国
项目类别：
Research Grants
财政年份：
2014
资助国家：
德国
起止时间：
2013-12-31 至 2019-12-31
项目状态：
已结题

来源：
https://gepris.dfg.de/gepris/projekt/252474060?language=en
关键词：
Multidimensional analysis nanoparticulate structures using

项目摘要

Objective of this project is the development of the multiwavelength-detector (MWL-detector) in the analytical ultracentrifuge (AUC) and its application in particle technology as a method for multidimensional particle analysis. Sedimentation and extinction data are obtained simultaneously by means of MWL-AUC. Such data can be used to determine broad multimodal particle size distributions (PSDs) as well as the shape and optical properties of nanoparticles (NPs). The key questions arising from the first funding period will be complemented and completed in the second funding period by the development of new methods. By means of a dynamic rotor speed ramp even very broad multimodal PSDs reaching from a few nanometers to several microns can be analyzed with high resolution. A software package developed in the first funding period (HDR-MULTIFIT) will be extended in such way that complex sedimenting and floating systems can be characterized. An increased dynamic range is accomplished due to a new analysis routine based on direct boundary modelling. Further emphasis will be put on the characterization of semiconductor NPs less than 10 nm in diameter. New algorithms will allow to determine the size and density of ZnO, CuInS2, CdSe and CdS NPs simultaneously and with high resolution. Furthermore, the shape of ZnO- and silver-nanotubes will be investigated. For this purpose, methods developed in the first funding period for graphene oxide will be adapted and extended. The thicknesses and length distributions of the nanotubes can be determined without the necessity of imaging techniques by conducting complementary experiments using a scanning mobility particles sizer. The required correlation of both techniques will first be validated by means of comparative studies using spherical NPs. Besides size and shape of NPs also optical properties become available using strong data evaluation techniques. Implementations in free software packages will be realized in close collaboration with Prof. B. Demeler (U Texas) and Dr. W. F. Stafford (Harvard Medical School). By means of this the size - band gap correlation of semiconductor NPs will become accessible using AUC. For patchy particles the surface coverage of silver or gold on SiO2 or polystyrene NPs can be determined. Moreover, the particle morphology can be correlated with the optical properties. In addition, algorithms will be developed to determine the refractive indices of materials such as pigments by means of MWL-AUC.

该项目的目标是开发分析超速离心机 (AUC) 中的多波长检测器 (MWL 检测器) 及其在颗粒技术中的应用，作为多维颗粒分析的方法。沉降和消光数据通过MWL-AUC同时获得。此类数据可用于确定广泛的多峰粒径分布 (PSD) 以及纳米粒子 (NP) 的形状和光学特性。第一个资助期提出的关键问题将在第二个资助期通过新方法的开发得到补充和完成。通过动态转子速度斜坡，甚至可以高分辨率分析从几纳米到几微米的非常广泛的多模态 PSD。第一个资助期开发的软件包（HDR-MULTIFIT）将进行扩展，以表征复杂的沉积和漂浮系统。由于基于直接边界建模的新分析例程，实现了动态范围的增加。进一步的重点将放在直径小于 10 nm 的半导体纳米颗粒的表征上。新算法将能够同时且高分辨率地确定 ZnO、CuInS2、CdSe 和 CdS NP 的尺寸和密度。此外，还将研究氧化锌和银纳米管的形状。为此，将调整和扩展在第一个资助期开发的氧化石墨烯方法。通过使用扫描迁移率粒度仪进行补充实验，无需成像技术即可确定纳米管的厚度和长度分布。两种技术所需的相关性将首先通过使用球形纳米粒子的比较研究来验证。除了纳米颗粒的尺寸和形状之外，使用强大的数据评估技术也可以获得光学特性。免费软件包的实施将通过与 B. Demeler 教授（德克萨斯大学）和 W. F. Stafford 博士（哈佛医学院）的密切合作来实现。通过这种方式，可以使用 AUC 来了解半导体 NP 的尺寸 - 带隙相关性。对于斑片状颗粒，可以确定 SiO2 或聚苯乙烯纳米粒子上银或金的表面覆盖率。此外，颗粒形态可以与光学性质相关。此外，还将开发算法，通过 MWL-AUC 确定颜料等材料的折射率。