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Studies on the phase transition of √3 x√3-Ag structures formed on the Si(111) surface

Studies on the phase transition of √3 x√3-Ag structures formed on the Si(111) surface
Si(111)表面√3 x√3-Ag结构的相变研究
批准号:
13450018
负责人:
TAKAHASHI Toshio
金额:
$9.47万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2001
资助国家:
日本
项目状态:
已结题
起止时间:
2001 至 2002

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中文摘要
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英文摘要
A sample manipulator, regulating the temperature from 50 K to 1400K, has been designed and fabricated for the measurements of surface X-ray diffraction planned at the beamline 15B2 of the Photon Factor in KEK.The Si(111)/3x/3-Ag surface has been formed by depositing a monolayer of silver on the clean Si(111) surface kept at 500K. The measurements of grazing incidence x-ray diffraction have been done both at a low temperature of 50K and room temperature. The integrated intensities obtained at both temperatures for 26 diffraction spots have shown different intensity distributions. Furthermore, at low temperatures, diffuse scattering has been observed, indicating the formation of twin structures in which Ag atoms forming a triangle rotate in opposite directions each other around its center. Thus the symmetry of the surface structure changes from pSm to pS.The least squares analysis of intensity data also showed that the surface takes an inequvalent Triangle structure with p3 symmetry proposed by first-principles calculations and STM studies at low temperatures, while the surface is well explained by the well-known Honeycomb Chained Triangle model if anisotropic thermal vibrations are taken into account at room temperature. The result also indicates that the phase transition belongs to a displacive one with structural changes, and doesn't support order-disorder phase transitions proposed on the basis of the Inequvalent Triangle structures.
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T.Takahashi: "X-ray diffraction study of the phase transition of Si(111)√<3>×√<3>-Ag surface"Surface Review and Letters. (in press).
T. Takahashi:“Si(111)√<3>×√<3>-Ag 表面相变的 X 射线衍射研究”表面评论和快报(正在出版)。
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通讯作者:
A.Hata: "Crystal Orientation of Silver Films on Silicon Surfaces Revealed by Surface X-Ray Diffraction"Surface Review and Letters. (in press).
A.Hata:“通过表面 X 射线衍射揭示硅表面银膜的晶体取向”表面评论和快报。
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通讯作者:
高橋 敏男: "X線分析の進歩33(分担)"(株)アグネ技術センター. 18 (2003)
高桥敏夫:“X射线分析的进展33(共享)”Agne技术中心有限公司18(2003年)
DOI: --
发表时间:
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作者: []
通讯作者:
T.Takahashi: "X-ray diffraction study of the phase transitions of Si(111)√<3>×√<3>-Ag surface"Surface Review and Letters. (in press).
T. Takahashi:“Si(111)√<3>×√<3>-Ag 表面相变的 X 射线衍射研究”表面评论和快报(正在出版)。
DOI: --
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作者: []
通讯作者:
19
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    • 项目类别:
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    • 批准年份:
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    • 负责人:
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