Development of Low Temperature Deposition Process of Carbon Thin Film by Low Frequency 50Hz Plasma CVD.
Development of Low Temperature Deposition Process of Carbon Thin Film by Low Frequency 50Hz Plasma CVD.
批准号:
02555056
负责人:
SHIMOZUMA Mitsuo
金额:
$2.18万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Developmental Scientific Research (B)
财政年份:
1990
资助国家:
日本
项目状态:
已结题
起止时间:
1990 至 1991
中文摘要
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英文摘要
Hydrogenated amorphous carbon (a-C : H) films show large thermal conductivity, chemical inertness, high electrical resistivity and breakdown field, and optical transparency, all of which are suitable for the coating material in microelectronics as well as in mechanical applications. A number of reports have been published on the preparation of a-C : H films by various methods. The low-temperature formation of such an a-C : H film is required for microelectronics application. The purpose of the present study is to deposited of amorphous carbon films on unheated substrate using low frequency 50Hz plasma CVD with hydrogen and methane (H_2+CH_4) mixtures. The results obtained may be summarized as below.1) Major electrical and optical properties of the present a-C : H films were measured. The films were highly transparent and showed very uniform interference color. The refractive index, resistivity, breakdown field strength and the optical band gap of the obtained a-C : H film were 2.4, 10^ … More <14> OMEGA cm, 10^6 V/cm and 4.0 eV, respectively. The deposition rate of a-C : H films under the condition specified above was 60 A/h.2) Infrared absorption as well as Raman spectroscopy showed that the film predominantly consisted of sp^3-bonded C.3) The electron temperature for H_2+CH_4 plasma at 50Hz to 13.56MHz plasma power frequency range was measured from the two-line radiance ratio method using the Balmer lines (Halpha, Hbeta). The electron temperature slowly decreased with increased plasma frequency below 200 kHz, but rapidly decreased between 200 kHz and 13.56MHz. The electron temperature was 16000 K at 1kHz and 8200 K at 13.56 MHz. Accordingly, it was deduced that the electron temperature of low-frequency plasmas is larger than that in high-frequency plasmas.4) From these results, it appears that dissociation of H_2+CH_4 gas is accelerated by high temperature electrons in 50Hz plasma. Moreover, the positive ion in 50Hz plasmas bombard on the deposited film, and the bombarding ion energy is spent as migration energy for rearrangement of deposited atoms. Therefore, the deposited a-C : H films by the 50Hz plasma CVD have the high-quality properties without substrate heating. Less
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下妻 光夫,石川 基博,栃谷 元,田頭 博昭: "低周波50HzプラズマCVD法による非加熱基板上へのシリコン酸化膜生成" 電気学会論文誌A. Vol.111A. 1064-1070 (1991)
Mitsuo Shimotsuma、Motohiro Ishikawa、Hajime Tochiya、Hiroaki Tagashira:“通过低频 50Hz 等离子体 CVD 方法在未加热基板上生成氧化硅膜”日本电气工程师学会会刊 A.第 1064-1070 卷(1991 年)。
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F.Ishizuka: "Measurement of the effective ionization coefficient in Ar and C_3F_8 mixtures" The Transactions of The Institute of Electrical Engineers of Japan. 111ーA. (1991)
F.Ishizuka:“Ar 和 C_3F_8 混合物中有效电离系数的测量”,日本电气工程师学会汇刊 111-A。
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G. Tochitni, M. Shimozuma and H. Tagashira: "Estimation of silicon oxide films deposited by 50Hz plasma CVD using teos" Symposium on Plasma Processing. 9. 115-118 (1992)
G. Tochitni、M. Shimozuma 和 H. Tagashira:“使用 Teos 对通过 50Hz 等离子 CVD 沉积的氧化硅薄膜进行估计”等离子处理研讨会。
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M.Shimozuma: "Diagnostics of H_2+CH_4 plasma for chemical vapor deposition by optical spectroscopy" Journal of Applied Physics. 67. (1991)
M.Shimozuma:“通过光谱诊断化学气相沉积的 H_2 CH_4 等离子体”应用物理学杂志。
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M.Shimozuma,G.Tochitani and H.Tagashira: "Optical emission diagnostics of H_2+CH_4 50Hz-13.56MHz plasmas for chemical vapor deposition" Journal of Applied Physics. Vol.70. 645-648 (1991)
M.Shimozuma、G.Tochitani 和 H.Tagashira:“用于化学气相沉积的 H_2 CH_4 50Hz-13.56MHz 等离子体的光学发射诊断”应用物理学杂志。
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共 24 条
Development of Thin Film Radiation Detectors using TiO_2 film by plasma CVD method
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批准号:15560267
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项目类别:Grant-in-Aid for Scientific Research (C)
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资助金额:$2.37万
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财政年份:2003
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负责人:SHIMOZUMA Mitsuo
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依托单位:
Low Temperature Deposition of TiN Diffusion Barrier Metal for Integrated Circuit by Low Frequency Plasma CVD
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批准号:10650298
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资助金额:$2.05万
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财政年份:1998
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负责人:SHIMOZUMA Mitsuo
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依托单位:
Deveiopment of Room Temperature Deposition Process of Silicon Nitride Film by Low Frequency Plasma CVD.
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批准号:61850049
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项目类别:Grant-in-Aid for Developmental Scientific Research
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资助金额:$2.75万
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财政年份:1986
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负责人:SHIMOZUMA Mitsuo
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依托单位:
Selectively doped heterojunction CCD
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批准号:59850047
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项目类别:Grant-in-Aid for Developmental Scientific Research
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资助金额:$5.5万
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财政年份:1984
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负责人:SHIMOZUMA Mitsuo
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依托单位:
海外基金