Fabrication of Nanometer Structure and Its Application
Fabrication of Nanometer Structure and Its Application
批准号:
06044139
负责人:
TAKAI Mikio
金额:
$6.91万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Overseas Scientific Survey.
财政年份:
1994
资助国家:
日本
项目状态:
已结题
起止时间:
1994 至 1995
中文摘要
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英文摘要
Fabrication of nanometer structure and its application have been investigated by a joint research between Osaka University and Fraunhofer Institut fuer Feskoerpertechnologie under the International Scientific Research Program of the Ministry of Education, Science, Sport and Culture.Localized electrolytic reaction by a scanning tunneling microscope (STM) tip, dipped in a solution, induced a localized metal deposition with a size of several hundred nanometers, while a metal-covered STM tip could realize a controlled deposition with a size of nanometer by field evaporation. Metal species could be controlled by a precise adjustment of applied pulsed-bias between the tip and a target sample, which would determine the electric field for field evaporation on the STM tip. This technique would facilitate to fabricate metal electrode structures of quantum electron devices such as single electron transistors. Nano-scale interdigital metal structures would also provide a new sensing application.Medium energy ion scattering with and without focused ion beams has been applied to modified surface nano-structures in order to characterize the atomic positions of ad-atoms. The results were compared with those investigated by STM to exactly locate ad-atoms on crystalline surface.A silicon (Si) nanometer structure by anodization, porous Si, has been applied to electron emitter tips of field emission arrays (FEAs). FEAs with nano-structure emission tips showed enhanced emission by an order of magnitude over FEAs with conventional single crystalline Si emitter tips. Further application of nano-structures fabricated by the technique developed in this study is in progress.
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H.Andoh: "Nanoscale Deposition from a Metal-Covered Scanning Tunneling Microscope Tip" J.Appl. Phys.(in press).
H.Andoh:“金属覆盖的扫描隧道显微镜尖端的纳米级沉积”J.Appl。
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M.Takai: "Laser Surface Processing of Thin Films for Micro Electronics Application" SPIE-The International Society for Optical Engineering(to be published).
M.Takai:“用于微电子应用的薄膜激光表面处理”SPIE-国际光学工程学会(待出版)。
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R.Mimura: "Development of a 200kV FIB System for Nondestructive Three Dimensional Surface Analysis" Nucl. Instr. and Methods. B85. 756-759 (1994)
R.Mimura:“用于无损三维表面分析的 200kV FIB 系统的开发”Nucl。
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M.Takai: "Nuclear Microprobe Development and Application to Microelectronics" Nucl. Instr. and Methods. B85. 664-675 (1994)
M.Takai:“核微探针的开发及其在微电子学中的应用”Nucl。
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作者:
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通讯作者:
H.Andoh: "Nanoscale Deposition from a Metal-Covered Scanning Tunneling Microscope Tip" J.Appl.Phys.(in press).
H.Andoh:“金属覆盖的扫描隧道显微镜尖端的纳米级沉积”J.Appl.Phys.(正在出版)。
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共 15 条
Electron emission from pyroelectric crystal excited by laser light and its miniature X-ray source application
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批准号:23360022
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$12.4万
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财政年份:2011
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负责人:TAKAI Mikio
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依托单位:
Fabrication of Electron Source with Electron-Wave Interference by Nano Beam Induced Deposition Process
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批准号:19206008
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$28.95万
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财政年份:2007
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负责人:TAKAI Mikio
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依托单位:
Fabrication of Field Emitter Arrays Using Beam Assisted Processing and Their Stabilization
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批准号:12135205
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项目类别:Grant-in-Aid for Scientific Research on Priority Areas
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资助金额:$21.44万
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财政年份:2000
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负责人:TAKAI Mikio
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依托单位:
High Brightness Electron Source Array and Its Development to Vacuum Microelectronics (Summary)
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批准号:12135101
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项目类别:Grant-in-Aid for Scientific Research on Priority Areas
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资助金额:$3.58万
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财政年份:2000
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负责人:TAKAI Mikio
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依托单位:
Development of highly sensitive analysis technique for semiconductor process induced contamination impurities
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批准号:11694157
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项目类别:Grant-in-Aid for Scientific Research (A)
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资助金额:$9.91万
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财政年份:1999
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负责人:TAKAI Mikio
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依托单位:
Fabrication and Characterization of Vacuum Nano Electron Source by in-situ Beam Processing
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批准号:10450138
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项目类别:Grant-in-Aid for Scientific Research (B)
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资助金额:$7.87万
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财政年份:1998
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负责人:TAKAI Mikio
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依托单位:
Development of Three Dimensional Nano Analysis Technique
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批准号:08044148
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项目类别:Grant-in-Aid for international Scientific Research
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资助金额:$8.9万
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财政年份:1996
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负责人:TAKAI Mikio
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依托单位:
Development of Nanometer Ion Beam Processing Technology
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批准号:02044092
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项目类别:Grant-in-Aid for international Scientific Research
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资助金额:$8.7万
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财政年份:1990
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负责人:TAKAI Mikio
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依托单位: