Tribology design of micromachine surfaces using the modofication of Fullerene C_<60>
Tribology design of micromachine surfaces using the modofication of Fullerene C_<60>
批准号:
07555054
负责人:
OHMAE Nobuo
金额:
$5.18万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
1995
资助国家:
日本
项目状态:
已结题
起止时间:
1995 至 1996
中文摘要
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英文摘要
The objective of this study was to develop ultrasmooth Fullerene C_<60> films for solving microtribological problems of micromachines. For this purpose, molecular beam epitaxy (MBE) has been used to modify molybdenum disulfide (MoS_2) and highly oriented pyrographite (HOPG) surfaces with C_<60> sublimated from the Knudsen cell. The growth and structure of MBE grown C_<60> have been analyzed in-situ with the reflection high energy electron diffraction (RHEED), and it was found that the C_<60> films show close-packed epitaxial growth with its lattice constant of 1.0nm. Thick film with more than 10 monolayrs also showed smooth surface having fcc structure. Atomic force microscopy (AFM) signified that thick C_<60> films have three-fold symmetry domain structure, which coincides with the results obtained by RHEED.The three-fold domain structure of C_<60> has only been made clear by the research group in Basel University, Switzerland and by this study.Microtribolgical properties of MBE grown C_<60> films have been conducted in an ordinary atmosphere using AFM and friction force microscopy (FFM). Ultralow friction was found for C_<60> films. Thick films with more than 10 monolayrs also showed low friction. Friction coefficients of 0.019 and 0.012 were found for MoS_2 and HOPG substrates, respectively. These values are much lower than those reported by the other three research groups, and this may be caused by the uniform and smooth film structure prepared by MBE.Hydrophobic property against water molecules contained in air was found for MBE grown C_<60> films. This strongly suggests microtribological applications of MBE grown C_<60> films to micromachine.
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Ohmae,N.: "Visual observation of exo-sites with atomic resolution using field ion microscopy" Proc.11th Int'l Symp.Exoelectron Emission and Applications,Poland,Sept.11-17,1994. 245-251 (1994)
Ohmae,N.:“使用场离子显微镜以原子分辨率对外位点进行视觉观察”Proc.11th Intl Symp.外电子发射和应用,波兰,1994 年 9 月 11-17 日。
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H.Nakagawa, M.Tagawa, M.Umeno and N.Ohmae: "Field ion microscopy of MBE grown C_<60>" Fullerenes '96. 69 (1996)
H.Nakakawa、M.Takawa、M.Umeno 和 N.Ohmae:“MBE 生长的 C_<60> 的场离子显微镜”富勒烯 96。
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Ohmae,N.: "Field ion microscopy of microdeformations induced by metallic contacts." Proc.Int'l Indentation Workshop,Cambridge,UK,Jan.9-12,1996,will appear in Phil.Mag.A. (in printing). (1996)
Ohmae,N.:“金属接触引起的微变形的场离子显微镜。”
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N.OHMAE: "Field ion microscopy of microdeformation induced by metalic contacts" Philosophical Magazine A. 74,5. 1319-1327 (1996)
N.OHMAE:“金属接触引起的微变形的场离子显微镜”哲学杂志 A. 74,5。
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大前伸夫: "エキソ電子とトライボロジー" トライボロジスト. 40. 363-368 (1995)
Nobuo Ohmae:“外电子和摩擦学”摩擦学家。 40. 363-368 (1995)
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共 17 条
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海外基金