Methodological study to measure the magnetization of individual layer in magnetic multilayers by soft X-ray Kerr effect

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The purpose of this study is to develop a method to measure the magnetization of individual layer in magnetic multilayers by the observation of angular dependence of magnetic Kerr effect in the soft X-ray region.At the first time, the design principle to obtain good multilayer polarizers was established. Next by the use of the multilayer polarizers, the magnetic Kerr rotation apparatus which can be also used for the Faraday rotation measurements was instrumented. After that, the Faraday rotation and magnetic Kerr rotation experiments were performed on Ni and Co films around their M_<2,3> absorption edges at UVSOR facility and the consistency of both results was checked. These studies were reported at the 13^<th> Int. Conf. on Vacuum Ultraviolet Radiation Physics (Trieste, 2001). Furthermore, the Faraday rotation measurements were carried out on Co/Pt magnetic multilayers around M_<2,3> edges of Co and N_<6,7> edges of Pt to check whether the magnetic rotation measurements can be applied to the magnetic multilayers. The magnetization was checked by a vibrating sample magnetometer at Shimada Lab. From the Faraday rotation experiments, it was found that the Pt atoms are magnetized and the magnetization has interesting dependence on the thickness of layers. Finally, the Kerr rotation experiments on Co/Cu multilayers were carried out around M_<2,3> edges of Co and Cu. The analysis of the magnetization of individual layer is now in progress.