Doping of Functional Impurities in Silicon Nanocrystals and Nanowires for Novel Properties
Doping of Functional Impurities in Silicon Nanocrystals and Nanowires for Novel Properties
批准号:
21510112
负责人:
MURAKAMI Kouichi
金额:
$2.91万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (C)
财政年份:
2009
资助国家:
日本
项目状态:
已结题
起止时间:
2009 至 2011
中文摘要
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英文摘要
We have investigated 1)hydrogen (H) passivation of the interfaces of SiO2 and Si crystalline cores in SiNWs and SiNCs, and 2) novel properties for impurity-doped SiNWs and SiNCs. It was found in this study that donor and acceptor impurities with each maximum solubility can be doped in them and show the opposite segregation effects, and novel optical and magnetic properties are demonstrated in H-passivated samples.
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Siナノワイヤ中のBアクセプタ濃度分布の定量評価
Si纳米线中B受体浓度分布的定量评估
DOI:
--
发表时间:
2010
期刊:
影响因子:
--
作者:
[滝口亮, 石田慎哉, 横野茂輝, 深田直樹, 陳君, 関口隆史, 村上浩一]
通讯作者:
村上浩一
Siナノワイヤにイオン注入したBの電気の活性化
注入硅纳米线的 B 离子的电激活
DOI:
--
发表时间:
2009
期刊:
影响因子:
--
作者:
[齋藤直之, 石田慎哉, 横野茂輝, 深田直樹, 陣君, 関口隆史, 菱田俊一, 村上浩一]
通讯作者:
村上浩一
DOI:
10.1021/nl103773e
发表时间:
2011-02-01
期刊:
NANO LETTERS
影响因子:
10.8
作者:
[Fukata, Naoki, Ishida, Shinya, Murakami, Kouichi]
通讯作者:
Murakami, Kouichi
DOI:
10.1143/jjap.48.081201
发表时间:
2009-08
期刊:
Japanese Journal of Applied Physics
影响因子:
1.5
作者:
[K. Murakami;M. Tsujimura;Ryota Shirakawa;N. Uchida;N. Fukata]
通讯作者:
K. Murakami;M. Tsujimura;Ryota Shirakawa;N. Uchida;N. Fukata
DOI:
10.1063/1.3088871
发表时间:
2009-03
期刊:
Journal of Applied Physics
影响因子:
3.2
作者:
[K. Murakami;Ryota Shirakawa;M. Tsujimura;N. Uchida;N. Fukata;S. Hishita]
通讯作者:
K. Murakami;Ryota Shirakawa;M. Tsujimura;N. Uchida;N. Fukata;S. Hishita
共 10 条
Ethnological Research on the Cultures of the Immigrant People to Karafuto in Japan Era, 1905-1945
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批准号:21320167
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$9.82万
-
财政年份:2009
-
负责人:MURAKAMI Kouichi
-
依托单位:
Control of Hydrogen in Si and its Application to Thin Film Transistor
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批准号:11555001
-
项目类别:Grant-in-Aid for Scientific Research (B)
-
资助金额:$8.19万
-
财政年份:1999
-
负责人:MURAKAMI Kouichi
-
依托单位:
Measurement and Evaluation of Defects induced by Processing of Small Regions by means of Interface-Barrier-Controlled Electron Spin Resonance
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批准号:62550220
-
项目类别:Grant-in-Aid for General Scientific Research (C)
-
资助金额:$1.28万
-
财政年份:1987
-
负责人:MURAKAMI Kouichi
-
依托单位:
海外基金