Light Element Analysis Facility - LEAF

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Electron Microscopy tends to focus upon analysis of the heavier elements; however the lighter elements often have a critical role to pay. Furthermore, in soft matter and organic materials, it is ofteny only light elements that are present. With the advent of new technologies, it has become possible to analyse for light elements with much greater precision. We are requesting support for a new light element analysis facility to be housed in our interdisciplinary Electron Microscopy Centre complementing the existing equipment (2 TEM's, a FIB and 2 SEM's). We propose to build upon our existing Electron Microscopy facilities by adding an electron probe microanalyser (EPMA), a separate Soft X-ray Emission Spectrometer (SXES) system and a confocal Raman microscope. This will allow us to probe from elemental Li up to O and beyond, giving detailed compositional, electronic and spatial analysis to support research in a range of critical topics.