Thin film x-ray diffraction

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Thin film materials offer new ways to tune functionality, but require specialist probes. The core equipment of a thin-film x-ray diffractometer (XRD) sought here will underpin a broad range of research into advanced materials. The thin film XRD system will be embedded within the Centre for Designer Quantum Materials, and will provide a new characterization tool to enable a broad spectrum of research including:a) establishing structure property relations in designer heterostructures and thin films of a wide range of materials, underpinning the materials science, physics, and chemistry of advanced functional materials in single crystal and thin film form;b) providing crucial underpinning characterization to develop new energy materials, platforms for next generation technologies, new systems for energy harvesting, and materials-based quantum technologies;c) allowing an integrated approach to the design of new advanced and quantum materials through combined growth, structural and spectroscopic characterization facilities, creating a centre of excellence for designer advanced and quantum materials.Access to the facility will be provided and managed through the Centre for Designer Quantum Materials, providing a single point of contact for our facilities, and ensuring that its capabilities are available to users from across St Andrews, Scotland, and beyond.