Nanoparticulate Coatings Enhance Ion Detection

纳米颗粒涂层增强离子检测

• 批准号: 10259237
• 负责人: John Albert Schultz
• 金额: $ 79.95万
• 依托单位: IONWERKS, INC.
• 依托单位国家: 美国
• 财政年份: 2014
• 资助国家: 美国
• 起止时间: 2014-09-25 至 2023-08-31
• 项目状态: 已结题
• 来源: https://reporter.nih.gov/project-details/10259237
• 关键词: Alloys; Area; Atmosphere; Biological Sciences; Charge; Computer software; Data; Deposition; Detection; Dose; Electrons; Equipment; Film; Fluorescence Microscopy; Gases; Goals; Height; Helium; Individual; Ions; Kinetics; Legal patent; Masks; Measurement; Measures; Methods; Microscope; Microscopy; Modeling; Modification; Morphology; Outcome; Performance; Phase; Photons; Physics; Physiologic pulse; Positron-Emission Tomography; Sales; Source; Surface; Techniques; Technology; Testing; Thick; Thinness; Transmission Electron Microscopy; United States National Institutes of Health; Work; atomic layer deposition; base; data acquisition; detector; improved; ion mobility; mass spectrometer; micropore; nanoparticulate; nanoscale; particle; success; time of flight mass spectrometry; tool

Project Summary A new thin film deposition technique for increasing the gain and sensitivity of existing microchannel ion detectors was proven in a previously completed NIH phase I. An increased Secondary Electron (SE) yield from these films was found to improve with ion doses of helium up to > 100 Coulombs/cm2 while the electron yield from the uncoated detector first surface decreased after 1 Coulombs/cm2. A NIH Phase II will use these films to vary elemental composition and morphology of the first surface to increase the first hit SE yield and to prolong the deposited layer lifetime. Detector testing will proceed with in-house ion and electron sources. Methods for putting these thin film coatings onto the sidewalls of the MCP (in addition to covering the front detector surface) should increase the detector gain and substantially prolong the detector lifetime of commercially available MCPs. We will emphasize use of the Zeiss Orion helium ion microscope at Rutgers to perform accelerated lifetime testing of the MCP pulse height, gain and first surface secondary electron yield from individual pores. Elemental composition change in the first hit area of the microchannel pore will also be determined by Nanoscale Rutherford backscattering within the Orion and will be correlated with the lifetime and yield measurement. The combination of the Zeiss Orion configured with the Ionwerks NanoRBS spectrometer should prove to be a crucial tool in detector physics. In addition the overall performance of the NanoRBS will improve when this spectrometer is retrofitted with newly enhanced MCPs from this phase II effort. .

项目摘要 一种新的提高现有薄膜增益和灵敏度的薄膜沉积技术 微通道离子探测器在先前完成的NIH第一阶段中得到证实 这些薄膜的二次电子(SE)产额随着氦离子剂量的增加而提高 高达&gt；100库仑/厘米2，而未镀膜探测器的电子产额为第一表面 在1库仑/cm~2后下降。美国国立卫生研究院第二阶段将使用这些薄膜来改变元素 第一表面的成分和形貌，以增加第一次命中SE的产量并延长 沉积层的寿命。探测器测试将在内部进行离子和电子测试 消息来源。 将这些薄膜涂层涂覆到MCP侧壁上的方法(除了 覆盖前探测器表面)应增加探测器增益并实质上延长 商用MCP的探测器寿命。 我们将强调在罗格斯大学使用蔡司猎户座氦离子显微镜进行 MCP脉冲高度、增益和第一表面二次电子的加速寿命测试 从单个毛孔中产生。核爆首发区域元素组成变化 微通道孔也将由纳米级卢瑟福背散射来确定 猎户座和将与寿命和产量测量相关。这两种技术的结合 配置了Ionwerks NanoRBS光谱仪的蔡司猎户座应该被证明是一个关键的 探测器物理学的工具。此外，NanoRBS的整体性能将在以下情况下得到改善 这台光谱仪改装了来自第二阶段工作的新增强型MCP。 。