Time-of-Flight Mass Spectrometry of Polymers

该研究项目得到分析和表面化学计划的支持，致力于飞行时间(TOF)质谱学(MS)在聚合物分析表征中的应用。在这项为期33个月的持续资助期间，范德比尔特大学的Hercules教授和他的学生将寻求建立TOF二次离子质谱仪(TOF-SIMS)裂解模式与定义明确的聚合物和聚合物混合物的分子结构之间的明确关联。此外，他们还将应用基质辅助激光解吸/电离飞行时间质谱仪(MALDI-TOF)对厚膜(大块)聚合物分析物进行分析表征。聚合物的分析表征是一个重要的技术问题，也是一个具有挑战性的问题。质谱学技术为各种聚合物分析物提供了多功能性和无与伦比的灵敏度。这项研究将使TOF-SIMS和MALDI-TOF MS能够可靠地用作表征这些无处不在的材料的分析工具。这项研究对材料降解和稳定化的广泛领域也具有重要的意义。

This research project, supported in the Analytical and Surface Chemistry Program, addresses the application of time-of-flight (TOF) mass spectrometry (MS) to the analytical characterization of polymers. During the tenure of this thirty-three month continuing grant, Professor Hercules and his students at Vanderbilt University will seek to establish definitive correlations between TOF secondary ion mass spectrometry (TOF-SIMS) fragmentation patterns and the molecular structures of well defined polymers and polymer blends. Additionally, they will apply matrix assisted laser desorption/ionization TOF MS (MALDI-TOF) to the analytical characterization of thick film (bulk) polymer analytes. The analytical characterization of polymers is a technologically important and challenging problem. Mass spectrometric techniques offer versatility and unparalleled sensitivity for a wide variety of polymer analytes. This research will enable TOF-SIMS and MALDI- TOF MS to be reliably used as analytical tools for the characterization of these ubiquitous materials. This research also has important implications for the broad field of materials degradation and stabilization.