SHF: Small: Achieving IC Quality through On-Going Diagnosis and Customized Test

提案ID：0916828 PI名称：Blanton Shawn Institution：Carnegie-Mellon University标题：通过持续的诊断和定制测试实现IC质量摘要计算机芯片测试的主要目标一直是并将继续是将好的芯片与坏的芯片(即不符合所需操作特性的芯片)分开。然而，测试现在正被扩展为一项增值努力。在这个项目中，我们正在对测试数据进行数据挖掘，以便持续监测芯片质量。我们建议使用芯片故障的诊断提取模型以及评估芯片质量的新技术。这两种方法都被纳入在线质量监控方法中，通过改变应用于计算机芯片的实际测试以更好地匹配当前故障芯片的特征来确保所需的质量水平。这种质量方法本质上是动态的，与典型方法相比是一个根本性的变化。无一例外，每个芯片制造商(英特尔、IBM等)假设芯片中的任何地方都可能出现任何类型的缺陷，这意味着每个制造的实例都必须以相当高的成本进行彻底测试。这类似于不进行一次诊断性检查就为每个患者开出治疗所有可能的疾病/疾病的药物。与传统方法相反，这项拟议的工作转而诊断过去失败的芯片，以确定哪些疾病？(即缺陷)实际上是在制造的IC内发生的。药方呢？(即，应用于芯片的测试)因此可以被改变和/或最小化以匹配所发现的疾病，而不是如现在所做的过度测试，从而以最小的成本改进芯片质量。

Proposal ID: 0916828 PI name: Blanton Shawn Institution: Carnegie-Mellon University Title: Achieving IC Quality through On-Going Diagnosis and Customized TestABSTRACTThe main objective of computer chip testing has and continues to be the separation of good chips from bad ones (i.e., ones that do not meet the desired operational characteristics). Test is now however being expanded as a value-added endeavor. In this project, we are data-mining test data in order to continuously monitor chip quality. We propose to use diagnosis-extracted models of chip failures along with a new technique for estimating chip quality. Both are incorporated in an on-line, quality-monitoring methodology that ensures a desired level of quality by changing the actual tests applied to a computer chip to better match the characteristics of currently-failing chips.This approach to quality is dynamic in nature and is a radical change from the typical approach. Without exception, each chip manufacturer (Intel, IBM, etc.) assumes that any type of defect can occur anywhere within their chip which means that each manufactured instance has to be thoroughly tested at considerable expense. This is akin to prescribing drugs for all possible diseases/ailments for every patient without performing one diagnostic examination. Opposed to the traditional approach, this proposed work instead diagnoses chips that have failed in the past to determine what ?diseases? (i.e., defects) actually are occurring within the fabricated ICs. The ?prescriptions? (i.e., the tests applied to the chips) can therefore be changed and/or minimized to match the diseases found instead of over-testing as is done now, leading to improved chip quality at minimal cost.