SaTC: STARSS: Combatting Integrated Circuit Counterfeiting Using Secure Chip Odometers

电子产品假冒是电子产品制造商、系统集成商和最终客户面临的一个日益严重的问题，估计每年造成数十亿美元的经济影响。与正品相比，这些假冒集成电路（ic）的可靠性降低，工作范围较小或性能较低。该项目通过设计和实施安全的芯片里程表来打击IC假冒，为IC提供安全的使用和使用年限，并提供来源认证，使系统集成商能够轻松辨别真假部件。这些技术将为集成电路提供类似于汽车里程表和车辆识别号码（VIN）的功能，可以安全地测量其里程，VIN唯一地标识其品牌、型号、制造日期和选项。该项目探讨了IC老化现象，以确定最准确、最能容忍变化的时间测量，以及最有效的大规模集成。调查人员研究可能针对IC里程表的攻击，并确定保护IC里程表免受每种攻击的最佳方法。该项目开发集成电路里程计测试芯片原型，将提供概念验证设计和实验测量数据，以支持理论分析和模型。

Electronics counterfeiting is a significant and growing problem for electronics manufacturers, system integrators, and end customers, with an estimated annual economic impact in billions of dollars. These counterfeit Integrated Circuits (ICs) can have degraded reliability, smaller operating ranges, or lower performance compared to the genuine article. This project combats IC counterfeiting, by designing and implementing secure chip odometers to provide ICs with both a secure gauge of use and age and an authentication of provenance to allow system integrators to easily discern genuine parts from counterfeit ones. These techniques will provide ICs with functionality analogous to a car's odometer and vehicle identification number (VIN) which can securely measures its mileage and the VIN uniquely identifies its make, model, date of manufacture, and options.This project explores the IC aging phenomenon to determine the most accurate, variation-tolerant time measurement, and the most efficient with respect to very large scale integration. The investigators study attacks that are possible against IC odometers, and determines the best method of securing IC odometers against each attack. The project develops fabricated IC odometer testchip prototypes, which will provide proof-of-concept designs and experimentally measured data to back theoretical analysis and models.