Multidimensional analysis of nanoparticulate structures using analytical ultracentrifugation with integrated multiwavelength detection

本项目的目的是开发分析超滤（AUC）中的多波长检测器（MWL检测器）及其在颗粒技术中作为多维颗粒分析方法的应用。通过MWL-AUC同时获得沉降和消光数据。这些数据可用于确定宽的多峰粒度分布（PSD）以及纳米颗粒（NP）的形状和光学性质。第一个供资期产生的关键问题将在第二个供资期通过制定新方法得到补充和解决。通过动态转子速度斜坡，甚至可以高分辨率分析从几纳米到几微米的非常宽的多模态PSD。第一个供资期间开发的软件包（人类发展报告-多功能信息系统）将得到扩展，以便能够对复杂的沉积和漂浮系统进行定性。由于一个新的分析程序的基础上，直接边界建模的动态范围增加。进一步的重点将放在直径小于10纳米的半导体纳米粒子的表征。新算法将允许同时以高分辨率确定ZnO、CuInS 2、CdSe和CdS纳米颗粒的尺寸和密度。此外，ZnO和银纳米管的形状将被研究。为此，在第一个资助期内开发的氧化石墨烯方法将得到调整和扩展。的纳米管的厚度和长度分布可以确定，而不需要成像技术，通过进行补充实验，使用扫描迁移率粒度仪。两种技术所需的相关性将首先通过使用球形NP的比较研究来验证。除了纳米粒子的大小和形状，光学特性也可以使用强大的数据评估技术。自由软件包的实现将与B教授密切合作实现。Demeler（U Texas）和W. F.斯塔福德（哈佛医学院）。通过这种方式，半导体纳米颗粒的尺寸-带隙相关性将变得可用AUC。对于片状颗粒，可以确定银或金在SiO2或聚苯乙烯NP上的表面覆盖率。此外，颗粒形态可以与光学性质相关。此外，还将开发算法，通过MWL-AUC确定颜料等材料的折射率。

Objective of this project is the development of the multiwavelength-detector (MWL-detector) in the analytical ultracentrifuge (AUC) and its application in particle technology as a method for multidimensional particle analysis. Sedimentation and extinction data are obtained simultaneously by means of MWL-AUC. Such data can be used to determine broad multimodal particle size distributions (PSDs) as well as the shape and optical properties of nanoparticles (NPs). The key questions arising from the first funding period will be complemented and completed in the second funding period by the development of new methods. By means of a dynamic rotor speed ramp even very broad multimodal PSDs reaching from a few nanometers to several microns can be analyzed with high resolution. A software package developed in the first funding period (HDR-MULTIFIT) will be extended in such way that complex sedimenting and floating systems can be characterized. An increased dynamic range is accomplished due to a new analysis routine based on direct boundary modelling. Further emphasis will be put on the characterization of semiconductor NPs less than 10 nm in diameter. New algorithms will allow to determine the size and density of ZnO, CuInS2, CdSe and CdS NPs simultaneously and with high resolution. Furthermore, the shape of ZnO- and silver-nanotubes will be investigated. For this purpose, methods developed in the first funding period for graphene oxide will be adapted and extended. The thicknesses and length distributions of the nanotubes can be determined without the necessity of imaging techniques by conducting complementary experiments using a scanning mobility particles sizer. The required correlation of both techniques will first be validated by means of comparative studies using spherical NPs. Besides size and shape of NPs also optical properties become available using strong data evaluation techniques. Implementations in free software packages will be realized in close collaboration with Prof. B. Demeler (U Texas) and Dr. W. F. Stafford (Harvard Medical School). By means of this the size - band gap correlation of semiconductor NPs will become accessible using AUC. For patchy particles the surface coverage of silver or gold on SiO2 or polystyrene NPs can be determined. Moreover, the particle morphology can be correlated with the optical properties. In addition, algorithms will be developed to determine the refractive indices of materials such as pigments by means of MWL-AUC.