INVESTIGATION OF DAMAGE MECHANISM AND ESTIMATION OF STRENGTH OF CARBON NANOTUBES AS ELECTRONIC MATERIAL UNDER HIGH-DENSITY ELECTRONIC CURRENT

碳纳米管有望应用于纳米电子材料。提出了一种通过提供高密度电流对碳纳米管进行故意损伤的加速测试方法。通过在不同大气和载荷条件下的测试，阐明了碳纳米管在电流作用下的损伤机理。在此基础上，建立了考虑损伤机理的碳纳米管强度评价方法。评价结果与实验结果定性吻合，并对碳纳米管在电流作用下的强度进行了连续评价。

Carbon nanotubes (CNTs) are expected to be applied to nano-sized electronic materials. A method of acceleration test to intentionally introduce damage to CNTs was developed by supplying high-density electronic current. Performing the test under various atmospheric and loading conditions the damage mechanism of CNT under electronic current was clarified. Furthermore, an evaluation method of strength of CNT was developed considering the damage mechanism. The evaluated results qualitatively agreed with experimental ones, and the strength of CNT under electronic current was successively evaluated.