Thin film x-ray diffraction

薄膜材料提供了调整功能的新方法，但需要专门的探针。这里寻求的薄膜x射线衍射仪（XRD）的核心设备将支持对先进材料的广泛研究。薄膜XRD系统将嵌入设计量子材料中心，并将提供一种新的表征工具，以实现广泛的研究，包括：a)在各种材料的设计异质结构和薄膜中建立结构性质关系，支持单晶和薄膜形式的先进功能材料的材料科学，物理和化学；B)为开发新能源材料、下一代技术平台、能量收集新系统和基于材料的量子技术提供关键的基础表征；C)通过结合生长、结构和光谱表征设施，允许采用综合方法设计新的先进和量子材料，为先进和量子材料的设计师创造一个卓越的中心。该设施的访问将通过量子材料设计中心提供和管理，为我们的设施提供单一联系点，并确保其功能可供来自苏格兰圣安德鲁斯及其他地区的用户使用。

Thin film materials offer new ways to tune functionality, but require specialist probes. The core equipment of a thin-film x-ray diffractometer (XRD) sought here will underpin a broad range of research into advanced materials. The thin film XRD system will be embedded within the Centre for Designer Quantum Materials, and will provide a new characterization tool to enable a broad spectrum of research including:a) establishing structure property relations in designer heterostructures and thin films of a wide range of materials, underpinning the materials science, physics, and chemistry of advanced functional materials in single crystal and thin film form;b) providing crucial underpinning characterization to develop new energy materials, platforms for next generation technologies, new systems for energy harvesting, and materials-based quantum technologies;c) allowing an integrated approach to the design of new advanced and quantum materials through combined growth, structural and spectroscopic characterization facilities, creating a centre of excellence for designer advanced and quantum materials.Access to the facility will be provided and managed through the Centre for Designer Quantum Materials, providing a single point of contact for our facilities, and ensuring that its capabilities are available to users from across St Andrews, Scotland, and beyond.