CDT Compound Semiconductor Physics (PhD Progression 1+3)

该项目将通过一组与一家大型高科技制造公司相关的例子，显著推进实用的光电子集成电路(OEIC)。第一个电路将使用彩色共聚焦轮廓术，这是一种成熟的技术，用于测量工业部件的形状，以及在部件是透明的情况下测量其厚度。系统通常包括一个光纤耦合的宽带光源、一个光纤分束器和一个分光计，所有这些都在远程控制箱中，以及在测量点具有轴向色散的物镜。由于尺寸和重量的优势以及不再需要通过机器布线的光纤，创建基于芯片的等效系统将使诸如在坐标测量机上的现场测量等应用成为可能。我们将研究将所有单个组件集成到光子集成电路中的新方案。这项工作将需要开发高效、匹配的发射器和探测器，使用波导，并根据硬件研究的一个或多个方案，将光谱仪、调制器、模拟电路全部集成在一个芯片上。这项研究的成功成果将产生一种新的、颠覆性的彩色共焦轮廓术技术，具有潜在的应用于许多光谱测量领域的潜力。接下来应该有更多的开创性系统。

This project will significantly advance practical optoelectronic-integrated-circuits (OEICs) with a suite of examples relevant to a major high-tech manufacturing company. The first circuit will use chromatic confocal profilometry, which is an established technique for measuring the shape of industrial parts and, where the part is transparent, its thickness. Systems commonly comprise a fibre-coupled broadband light source, a fibre splitter and a spectrometer all in a remote, control box, and an objective lens with axial chromatic dispersion at the point of measurement. Creating an equivalent chip based system will enable applications such as in-situ, on co-ordinate measuring machines, due to the size and weight advantages and the removal of the need for fibre routed through the machine. We will investigate novel schemes for integrating all the individual components into a photonic integrated circuit. The work will require the development of efficient, matched, emitters and detectors, the use of waveguides and, depending on the scheme or schemes investigated in hardware, spectrometers, modulators, analogue circuits, all integrated on a single chip. The successful outcome from the research will result in a novel, disruptive, technology for chromatic confocal profilometry with potential application to many areas of spectral measurement. Further ground breaking systems should follow.