Lifetime Reliability Aware Microprocessors

终生可靠性感知微处理器

• 批准号: 0541383
• 负责人: Sarita Adve
• 金额: --
• 依托单位: University of Illinois at Urbana-Champaign
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2006
• 资助国家: 美国
• 起止时间: 2006-03-01 至 2010-02-28
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=0541383&HistoricalAwards=false
• 关键词: Lifetime; Reliability; Aware; Microprocessors

Lifetime Reliability Aware MicroprocessorsAs CMOS scaling continues, increasingly smaller feature sizes and increasing power densities are accelerating the onset of wear-out or aging-related hard failures in processors. Current lower-level solution strategies will likely be inadequate to address this lifetime reliability problem. This research advocates higher-level, microarchitectural solutions for processor lifetime reliability. The first component of this work is in the development and validation of microarchitecture-level models, metrics, and tools that incorporate key failure mechanisms and their scaling behavior. The second component develops novel architectural solutions for the lifetime reliability problem, including dynamic reliability management and selective structural redundancy. The performance benefits from CMOS technology scaling over the last several decades have enabled the information revolution that has affected virtually every aspect of society. The problem of lifetime reliability addressed in this proposal is one of the key impediments to seeing continued benefits from CMOS scaling. The proposed work seeks to develop a fundamentally new approach to address this problem that will enable meeting the reliability goals critical for all processor manufacturers. This work is in collaboration with researchers from IBM which will provide needed industrial expertise as well as a path for technology transfer.

寿命可靠性感知微处理器随着CMOS规模的不断扩大，越来越小的特征尺寸和不断增加的功率密度正在加速处理器中与磨损或老化相关的硬故障的发生。当前较低级别的解决方案策略可能不足以解决这一终身可靠性问题。这项研究倡导更高级别的微体系结构解决方案，以提高处理器的寿命可靠性。这项工作的第一个组成部分是开发和验证微体系结构级别的模型、指标和工具，这些模型、指标和工具包含了关键的故障机制及其扩展行为。第二个组件为终身可靠性问题开发了新的体系结构解决方案，包括动态可靠性管理和选择性结构冗余。在过去的几十年里，从cmos技术的扩展中获得的性能优势使信息革命得以实现，这场革命几乎影响了社会的方方面面。这项提案中涉及的寿命可靠性问题是继续从cmos规模中获益的关键障碍之一。拟议的工作旨在开发一种全新的方法来解决这一问题，使其能够实现对所有处理器制造商至关重要的可靠性目标。这项工作是与IBM的研究人员合作进行的，IBM将提供所需的行业专业知识以及技术转移的途径。