Collaborative Research: Nonparametric Bayesian Modeling of Reliability of Nanoelectronics
Collaborative Research: Nonparametric Bayesian Modeling of Reliability of Nanoelectronics
批准号:
0926379
负责人:
Yue Kuo
金额:
$20.62万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2009
资助国家:
美国
项目状态:
已结题
起止时间:
2009-09-01 至 2013-08-31
中文摘要
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英文摘要
This grant provides funding for the investigation of reliability in nanoelectronics. Nanoelectronics is a driving force for strong economic growth in the United States. Reliability is recognized as one of the most critical factors in determining the success of nano fabrication and manufacturing. This collaborative project will be led by a nano device engineer and a reliability specialist. The objective of this interdisciplinary research is to investigate effective and practical nonparametric Bayesian methods to assess the reliability of nanoelectronic products during the early design and development stages. Specially, the proposed research tasks consist of two closely-related components: (i) an analytical study to develop practical nonparametric Bayesian methods for estimating important reliability measures of nanoelectronic devices, and (ii) an experimental study to validate the models by fabricating and characterizing newly developed nonvolatile memories based on nanocrystals embedded high-k thin films. Upon the successful completion of this project, new methods and tools that are critical to design and manufacture reliable nanoelectronic products will be developed. This will be the first systematic study in modeling and predicting reliability of nano products based on experimental data and nonparametric Bayesian methods which offer great flexibility and capability to address challenges in real products influencing yield and cost. The result will enable manufacturers to assess reliability of new nano products and involved costs in the early design and development stages, which would expedite products to the market. Furthermore, the new nonvolatile memory devices have practical applications in future generation integrated circuits (ICs) and data storage. This multidisciplinary research project will provides students with both theoretical and experimental education in reliability, semiconductor devices, thin film materials, and high-tech fabrication processes.
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批准号:1633580
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项目类别:Standard Grant
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财政年份:2007
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依托单位:
NER: Exploring the nano structural properties of the 2 nm interface layer of the metal oxide and its nano device characteristics
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批准号:0403280
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项目类别:Standard Grant
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资助金额:$10.0万
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财政年份:2004
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负责人:Yue Kuo
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依托单位:
SGER: Exploring A Novel Bipolar Thin-Film Transistor of Nanocrystalline Silicon Material
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批准号:0236835
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项目类别:Standard Grant
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资助金额:$6.99万
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财政年份:2003
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负责人:Yue Kuo
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依托单位:
NER: Exploring a Nanoscale Amorphous Silicon Thin Film Transistor
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批准号:0301960
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项目类别:Standard Grant
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资助金额:$8.0万
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财政年份:2003
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负责人:Yue Kuo
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依托单位:
SGER: Identifying and Characterizing Reliability Properties for a Sub 5 nm High k Dielectric Device
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批准号:0243409
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项目类别:Standard Grant
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资助金额:$9.71万
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财政年份:2003
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负责人:Yue Kuo
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依托单位:
NER: Exploring A Novel Plasma-Based Copper Nano-Line Etch Method for Nano-Devices And Circuits
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批准号:0103022
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项目类别:Standard Grant
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资助金额:$8.12万
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财政年份:2001
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负责人:Yue Kuo
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依托单位:
Acquisition of a Multi-Purpose, Multi-User Mask Aligner
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批准号:9912490
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项目类别:Standard Grant
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资助金额:$7.84万
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财政年份:2000
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负责人:Yue Kuo
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依托单位:
Amorophous Silicon-Based Thin Film Diodes
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批准号:0000806
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项目类别:Fellowship Award
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资助金额:$4.08万
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财政年份:2000
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负责人:Yue Kuo
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依托单位:
国内基金
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