SaTC: STARSS: Combatting Integrated Circuit Counterfeiting Using Secure Chip Odometers

SaTC：STARSS：使用安全芯片里程表打击集成电路假冒行为

• 批准号: 1441736
• 负责人: Kenneth Mai
• 金额: $ 30万
• 依托单位: Carnegie-Mellon University
• 依托单位国家: 美国
• 项目类别: Standard Grant
• 财政年份: 2014
• 资助国家: 美国
• 起止时间: 2014-10-01 至 2017-09-30
• 项目状态: 已结题
• 来源: https://www.nsf.gov/awardsearch/showAward?AWD_ID=1441736&HistoricalAwards=false
• 关键词: SaTC; STARSS; Combatting; Integrated; Circuit

Electronics counterfeiting is a significant and growing problem for electronics manufacturers, system integrators, and end customers, with an estimated annual economic impact in billions of dollars. These counterfeit Integrated Circuits (ICs) can have degraded reliability, smaller operating ranges, or lower performance compared to the genuine article. This project combats IC counterfeiting, by designing and implementing secure chip odometers to provide ICs with both a secure gauge of use and age and an authentication of provenance to allow system integrators to easily discern genuine parts from counterfeit ones. These techniques will provide ICs with functionality analogous to a car's odometer and vehicle identification number (VIN) which can securely measures its mileage and the VIN uniquely identifies its make, model, date of manufacture, and options.This project explores the IC aging phenomenon to determine the most accurate, variation-tolerant time measurement, and the most efficient with respect to very large scale integration. The investigators study attacks that are possible against IC odometers, and determines the best method of securing IC odometers against each attack. The project develops fabricated IC odometer testchip prototypes, which will provide proof-of-concept designs and experimentally measured data to back theoretical analysis and models.

对于电子产品制造商、系统集成商和终端客户来说，电子产品造假是一个严重且日益严重的问题，估计每年会造成数十亿美元的经济影响。与正品相比，这些假冒集成电路(IC)的可靠性降低、工作范围变小或性能降低。该项目通过设计和实施安全的芯片里程计来打击IC伪造，为IC提供安全的使用和年龄量规以及来源认证，使系统集成商能够轻松区分真假部件。这些技术将为IC提供类似于汽车里程表和车辆识别号(VIN)的功能，这些功能可以安全地测量其里程，VIN唯一地识别其制造商、型号、制造日期和选项。该项目探索IC老化现象，以确定最准确的、容忍变化的时间测量，以及对于超大规模集成的最高效率。调查人员研究针对IC里程计的可能攻击，并确定保护IC里程计免受每一次攻击的最佳方法。该项目开发组装的IC里程表测试芯片原型，将提供概念验证设计和实验测量数据，以支持理论分析和模型。