PFI:AIR - TT: Pulse Shaping for Increased Conversion Efficiency in Extreme Ultraviolet Lithography Sources for the Fabrication of Next Generation Integrated Circuits
PFI:AIR - TT:脉冲整形可提高极紫外光刻源的转换效率,用于制造下一代集成电路
基本信息
- 批准号:1701238
- 负责人:
- 金额:$ 19.99万
- 依托单位:
- 依托单位国家:美国
- 项目类别:Standard Grant
- 财政年份:2017
- 资助国家:美国
- 起止时间:2017-07-01 至 2019-06-30
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
This PFI: AIR Technology Translation project focuses on translating the concept of laser pulse shaping into an increase in the efficiency with which laser-created plasmas generate extreme ultraviolet light. The extreme ultraviolet (EUV) light is necessary to print the next generations of integrated circuits. The printing of the circuit pattern onto the wafer, known as lithography, is the single most critical and capital intensive part in the manufacturing of advanced integrated circuits. Advances in lithography have made possible the printing of progressively smaller features that have enabled the revolution in the information technology industry for the past 50 years. The printing of smaller features has strongly depended on the use of progressively shorter wavelengths of light. Extreme ultraviolet (EUV) lithography, a new projection lithography technique that uses a wavelength dramatically shorter than that of visible light, will make it possible to continue the progress in the fabrication of more powerful integrated circuits, sustaining the semiconductor industry's underlying business model, and the great societal impact that results from continued advances in information technology. While the amount of average power generated with the current technology of EUV light is sufficient to initiate the high volume manufacturing of the next generation of integrated circuits, significantly higher average powers are still required for high wafer throughput and cost effective manufacturing. This project will result in the proof of concept of a technological innovation, the application of a novel laser pulse sequencer that makes it possible synthetize laser pulses of arbitrary temporal shape to increase the efficiency of EUV light generation by plasmas. Such increase in efficiency is of significant commercial value, because it decreases the cost of ownership as it enables the use of proportionally smaller lasers necessary in the production of integrated circuits.The project addresses the need for higher average power and higher efficiency in the generation of EUV light for the printing of the next generations of integrated circuits. A prototype of a pulse sequencer will be engineered and will be used to optimize plasma conditions of electron temperature, density, plasma lifetime, and opacity for increased EUV light generation. The additional degrees of freedom in the plasma heating process is expected to lead to an increase in the efficiency of EUV light generation.In addition, the personnel involved in the project will include graduate and undergraduate students who will be trained in innovation through immersion in the development of novel technology and its translation to industry. The project will in this way contribute to the training of a proficient workforce in EUV technology, an area of high economic impact in which there is a high demand for engineers and scientists. The project engages ASML/Cymer. This partnership between an university and an industry leader enables this technology translation effort from research discovery towards commercialization reality.This project is jointly funded by the Division of Industrial Innovation and Partnerships and the Division of Engineering Education; reflecting the alignment of this project with the respective goals of the two divisions and their programs.
这个PFI:空气技术翻译项目的重点是将激光脉冲整形的概念转化为提高激光产生的等离子体产生极端紫外光的效率。极紫外(EUV)光是印刷下一代集成电路所必需的。将电路图案印刷到晶片上,即所谓的光刻,是先进集成电路制造中最关键、最耗资的部分。光刻技术的进步使得印刷越来越小的特征成为可能,这使得过去50年来信息技术行业的革命成为可能。印刷较小的特写在很大程度上依赖于使用逐渐变短的波长的光。极紫外(EUV)光刻是一种新的投影光刻技术,它使用的波长比可见光的波长短得多,它将使人们有可能继续在制造更强大的集成电路方面取得进展,维持半导体行业的基本商业模式,并保持信息技术持续进步所产生的巨大社会影响。虽然目前的极紫外光技术产生的平均功率足以启动下一代集成电路的大批量制造,但仍需要显著更高的平均功率来实现高晶圆生产能力和成本效益制造。该项目将证明一项技术创新的概念,即应用一种新型的激光脉冲定序器,使合成任意时间形状的激光脉冲成为可能,以提高等离子体产生极紫外光的效率。这种效率的提高具有重大的商业价值,因为它降低了拥有成本,因为它使生产集成电路所需的比例较小的激光器得以使用。该项目解决了在产生用于印刷下一代集成电路的极紫外光方面对更高平均功率和更高效率的需求。将设计一个脉冲序列器的原型,并将用于优化电子温度、密度、等离子体寿命和不透明度的等离子体条件,以增加EUV光的产生。等离子体加热过程中增加的自由度预计将导致EUV光产生效率的提高。此外,参与该项目的人员将包括研究生和本科生,他们将通过沉浸在新技术的开发及其转化为工业的过程中接受创新培训。该项目将以这种方式帮助培训一支精通EUV技术的劳动力队伍,这是一个经济影响很大的领域,对工程师和科学家的需求很高。该项目与ASML/Cmer接洽。一所大学和一家行业领先者之间的这种伙伴关系使这种技术从研究发现转化为商业化的努力得以实现。该项目由工业创新与伙伴关系部门和工程教育部门联合资助;反映了该项目与两个部门及其计划各自的目标的一致性。
项目成果
期刊论文数量(1)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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Jorge Rocca其他文献
Ponderomotive acceleration with high energy tilted ultrafast laser pulses
高能倾斜超快激光脉冲有质动力加速
- DOI:
- 发表时间:
2023 - 期刊:
- 影响因子:0
- 作者:
Patrick Hunt;Alex M. Wilhelm;Shoujun Wang;R. Hollinger;Ze’ev Shpilman;S. Z. Anaraki;Aaron Davenport;Daniel E. Adams;C. Menoni;Jorge Rocca;Charles Durfee - 通讯作者:
Charles Durfee
Jorge Rocca的其他文献
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{{ truncateString('Jorge Rocca', 18)}}的其他基金
PFI-TT: Enhancing the Mass Production of Advanced Integrated Circuits
PFI-TT:增强先进集成电路的量产
- 批准号:
2141227 - 财政年份:2022
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
REU Site: Engineering Applications of Extreme Ultra-Violet (EUV) Laser Light
REU 网站:极紫外 (EUV) 激光的工程应用
- 批准号:
1852537 - 财政年份:2019
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
REU Site: Engineering Applications of Extreme Ultra-Violet (EUV) Laser Light
REU 网站:极紫外 (EUV) 激光的工程应用
- 批准号:
1461231 - 财政年份:2015
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
OP: Transforming Table-top Soft X-Ray Lasers into High Average Power Devices
OP:将台式软 X 射线激光器转变为高平均功率设备
- 批准号:
1509925 - 财政年份:2015
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
NSF EUV ERC RET in Engineering & Computer Science Site Program
NSF EUV ERC RET 工程
- 批准号:
1301436 - 财政年份:2014
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
AIR Option 2: Research Alliance - Development of key technology for next generation projection lithography of integrated circuits at 6.X nm wavelength
AIR选项2:研究联盟——开发下一代6.X nm波长集成电路投影光刻关键技术
- 批准号:
1343456 - 财政年份:2013
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
REU Site: Engineering Applications of Extreme Ultra-Violet (EUV) Laser Light
REU 网站:极紫外 (EUV) 激光的工程应用
- 批准号:
1157036 - 财政年份:2012
- 资助金额:
$ 19.99万 - 项目类别:
Continuing Grant
High Energy Density Plasmas in Ultrafast Micro-Capillary Discharges
超快微毛细管放电中的高能量密度等离子体
- 批准号:
1004295 - 财政年份:2010
- 资助金额:
$ 19.99万 - 项目类别:
Continuing Grant
MRI-R2: Development of a high average power table-top extreme ultraviolet/soft x-ray laser beam line for science at the nanoscale
MRI-R2:开发用于纳米级科学的高平均功率台式极紫外/软 X 射线激光束线
- 批准号:
0960274 - 财政年份:2010
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
RET-Site Program in Light & Optics for the NSF EUV ERC
Light 中的 RET 站点程序
- 批准号:
0808763 - 财政年份:2008
- 资助金额:
$ 19.99万 - 项目类别:
Standard Grant
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