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SHF:Small:New models, design, and test methods for long-term aging of nanometer VLSI

SHF:Small:New models, design, and test methods for long-term aging of nanometer VLSI
SHF:Small:纳米VLSI长期老化的新模型、设计和测试方法
批准号:
1719047
负责人:
Sandeep Gupta
金额:
$44.0万
依托单位国家:
美国
项目类别:
Standard Grant
财政年份:
2017
资助国家:
美国
项目状态:
已结题
起止时间:
2017-08-15 至 2023-07-31

项目摘要

项目成果

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中文摘要
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英文摘要
Transistor aging refers to the phenomenon that a transistor degrades with use over time. Hence, as digital chips are used, transistor aging reduces their performance and increases power consumption. Aging also causes some chips to fail prematurely during their expected lifetimes (called lifetime failures). Since such failures can corrupt user data, cause expensive system downtime, and require expensive maintenance, industry practice requires lifetime failure rates to be of the order of 10 to 100 parts per million. This project will develop completely new methods and CAD tools for design and testing of digital chips to combat aging in uniquely efficient ways. These new methods and tools will dramatically improve yield, dramatically reduce power, and provide chips with extremely low lifetime failure rates, even as aging continues to grow in severity as we approach the end of Moore's Law. In turn, the society at large will reap significant benefits of this research, since lower cost digital systems with low lifetime failure rates will help improve many essential services, especially health, security, and finance. In addition, this project will train students and industry experts in the art and science of aging and its mitigation and prepare them for the era near and beyond the end of Moore's Law. Also, significant outreach effort will ensure that undergraduate students and students from groups underrepresented in STEM will participate in this research.This project has identified and will address three major limitations of existing aging research: serious inaccuracies of existing models in estimating long-term aging for real-life chip usage, the inability of existing memory designs to combat the most common type of memory aging, namely asymmetric aging, and the fact that existing approaches for post fabrication chip testing either provide extremely low yields or unacceptability high lifetime failure rates due to aging. Specifically, this project will develop completely new methods and tools for aging, demonstrate their effectiveness via extensive simulation studies and experiments on test chips, disseminate results and share new tools with academic and industry experts, and train students.
期刊论文(6)
专著(0)
科研奖励(0)
会议论文
DOI: 10.1109/vts48691.2020.9107571
发表时间: 2020-04
期刊: 2020 IEEE 38th VLSI Test Symposium (VTS)
影响因子: --
作者: [X. Zuo;S. Gupta]
通讯作者: X. Zuo;S. Gupta
Asymmetric sizing: An effective design approach for SRAM cells against BTI aging
不对称尺寸:SRAM 单元抗 BTI 老化的有效设计方法
DOI: --
发表时间: 2017
期刊: 2017 IEEE 35th VLSI Test Symposium (VTS
影响因子: --
作者: [Zuo, Xuan, Gupta, Sandeep]
通讯作者: Gupta, Sandeep
DOI: 10.1109/vts52500.2021.9794274
发表时间: 2022-04
期刊: 2022 IEEE 40th VLSI Test Symposium (VTS)
影响因子: --
作者: [B. Biswas;S. Gupta]
通讯作者: B. Biswas;S. Gupta
HW-BCP: A Custom Hardware Accelerator for SAT Suitable for Single Chip Implementation for Large Benchmarks
HW-BCP:适用于大型基准的单芯片实施的 SAT 定制硬件加速器
DOI: 10.1145/3394885.3431413
发表时间: 2021
期刊: 26th Asia and South Pacific Design Automation Conference (ASPDAC
影响因子: --
作者: [Park, Soowang, Nam, Jae-Won, Gupta, Sandeep K.]
通讯作者: Gupta, Sandeep K.
6
    Theory, methods, and tools for cross-layered design of uniquely efficient failure-resistant systems
    • 批准号:
      1255951
    • 项目类别:
      Continuing Grant
    • 资助金额:
      $18.0万
    • 财政年份:
      2013
    • 负责人:
      Sandeep Gupta
    • 依托单位:
    Verification of closed loop feedback/feed-forward control actions for safe medical devices
    • 批准号:
      1231590
    • 项目类别:
      Standard Grant
    • 资助金额:
      $7.99万
    • 财政年份:
      2012
    • 负责人:
      Sandeep Gupta
    • 依托单位:
    CSR: Small: Understanding and Modeling the Trade-Offs in Data Centers for Next-Generation Sustainable Management
    • 批准号:
      1218505
    • 项目类别:
      Standard Grant
    • 资助金额:
      $45.0万
    • 财政年份:
      2012
    • 负责人:
      Sandeep Gupta
    • 依托单位:
    NeTS:Small:Understanding the Impact of Unreliable Hardware on the Resilience of Networked Systems
    • 批准号:
      1117049
    • 项目类别:
      Standard Grant
    • 资助金额:
      $44.0万
    • 财政年份:
      2011
    • 负责人:
      Sandeep Gupta
    • 依托单位:
    国内基金
    海外基金
    昼夜节律性small RNA在血斑形成时间推断中的法医学应用研究
    • 批准号:
    • 项目类别:
      省市级项目
    • 资助金额:
      --
    • 批准年份:
      2024
    • 负责人:
    • 依托单位:
    tRNA-derived small RNA上调YBX1/CCL5通路参与硼替佐米诱导慢性疼痛的机制研究
    • 批准号:
    • 项目类别:
      省市级项目
    • 资助金额:
      10.0万元
    • 批准年份:
      2022
    • 负责人:
      张祥忠
    • 依托单位:
    Small RNA调控I-F型CRISPR-Cas适应性免疫性的应答及分子机制
    Small RNAs调控解淀粉芽胞杆菌FZB42生防功能的机制研究
    • 批准号:
      31972324
    • 项目类别:
      面上项目
    • 资助金额:
      58.0万元
    • 批准年份:
      2019
    • 负责人:
      高学文
    • 依托单位: