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Defects in pure-silica glass: study on non-radical defects and development of optical fibers for adverse environments.

Defects in pure-silica glass: study on non-radical defects and development of optical fibers for adverse environments.
纯石英玻璃的缺陷:非自由基缺陷的研究和恶劣环境下光纤的开发。
批准号:
62460121
负责人:
OHKI Yoshimichi
金额:
$4.16万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for General Scientific Research (B)
财政年份:
1987
资助国家:
日本
项目状态:
已结题
起止时间:
1987 至 1988

项目摘要

项目成果

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中文摘要
翻译
Photoluminescence measurements of the 1.9-eV (red) emission were carried out on high-purity silicaglasses subjected to -ray irradiation. The time decay of The 4.8-eV-excited-luminescence indicatesthe 4.8-eV absorption and the 1.9-eV luminescence arise at two different defect sitesand that an energy transfer occurs between the two defects. comparison with electron spin resonance观察suggests that the defect responsible for the 1.9-eV luminescence is the non-bridgingoxygen hole center (NBOHC:The 4.8-eV absorption band increases when The sample is heated in an oxygen atmosphere priorto - irradiation,即defect responsible is related to some form of excess oxygen。tentatively identified as a negatively charged non-bridging oxygen (Si-O^-) which is formed when aperoxy linkage traps a -induced electron,Si-O-O-Si + e^- Si-O^- + O-Si .Both the NBOHC and the defect responsible for the 4.8-eV absorptionmust be present in the glass for the 4.8-eV band excited 1.8-eV luminescence to occur。
英文摘要
Photoluminescence measurements of the 1.9-eV (red) emission were carried out on high-purity silica glasses subjected to -ray irradiation. The time decay of the 4.8-eV-excited-luminescence indicates that the 4.8-eV absorption and the 1.9-eV luminescence arise at two different defect sites, and that an energy transfer occurs between the two defects. comparison with electron spin resonance observations suggests that the defect responsible for the 1.9-eV luminescence is the non-bridging oxygen hole center (NBOHC: Si-O・). The 4.8-eV absorption band increases when the sample is heated in an oxygen atmosphere prior to -irradiation, suggesting that the defect responsible is related to some form of excess oxygen. The defect is tentatively identified as a negatively charged non-bridging oxygen ( Si-O^-) which is formed when a peroxy linkage traps a -induced electron, Si-O-O-Si + e^- Si-O^- + ・O-Si .Both the NBOHC and the defect responsible for the 4.8-eV absorption must be present in the glass for the 4.8-eV band excited 1.8-eV luminescence to occur.
期刊论文(35)
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会议论文
R.Tohmon;Y.Shimogaichi;H.Mizuno;Y.Ohki;K.Nagasawa;Y.Hama: Physical Review Letters.
R.Tohmon;Y.Shimogaichi;H.Mizuno;Y.Ohki;K.Nagasawa;Y.Hama:物理评论快报。
DOI: --
发表时间:
期刊:
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作者: []
通讯作者:
K.Nagasawa.;H.Mizuno.;Y.Yamasuka.;R.Tohomon.;Y.Ohki.;Y.Hama: "The Physics and Technology of Amorphous" Plenum Press, 1988 (SiO 2)
K.Nagasawa.;H.Mizuno.;Y.Yamasuka.;R.Tohomon.;Y.Ohki.;Y.Hama:“非晶的物理和技术”Plenum Press,1988 (SiO 2)
DOI: --
发表时间:
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作者: []
通讯作者:
R.Tohmon;Y.Yamasaka;K.Nagasawa;Y.Ohki;Y.Hama: Journal of Non-Gystalline Solids. 95&96. 671-678 (1987)
R.Tohmon;Y.Yamasaka;K.Nagasawa;Y.Ohki;Y.Hama:非晶体固体杂志。
DOI: --
发表时间:
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作者: []
通讯作者:
26
    Dielectric Properties and Insulation Diagnosis of Polymers by Ultra-wideband Dielectric and Absorption Spectroscopy
    • 批准号:
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    • 项目类别:
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    Dominant factors influencing dielectric properties in several biodegradable polymers
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