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Defect reduction of super widegap semiconductor AlN by high temperature metalorganic vapor phase epitaxy and device applications

Defect reduction of super widegap semiconductor AlN by high temperature metalorganic vapor phase epitaxy and device applications
高温有机金属气相外延减少超宽禁带半导体AlN缺陷及器件应用
批准号:
15206003
负责人:
AMANO Hiroshi
金额:
$30.62万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (A)
财政年份:
2003
资助国家:
日本
项目状态:
已结题
起止时间:
2003 至 2005

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中文摘要
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英文摘要
Blue, green and white light emitting diodes and violet laser diodes on sapphire substrates have been already commercialized which are based on the low temperature buffer layer technology developed by us. Applications of nitride semiconductors are not limited to visible range, but can be applied to ultraviolet range. Expected applications of solid state UV/DUV light emitters/detectors include sterilizer, DNA analyzer, laser knife, flame sensor, dermatology, molecular tweezers, weather observation, gas decomposition, photolithography, etc. Formerly, AlN was grown at or lower than 1,200□ on other materials such as sapphire or SiC. Our previous mass transport study showed that in order to achieve sufficient migration of Al precursor, AlN should be grown higher than 1,200□.The objective of this study is as follows ;(1)Growth of AlN substrate by sublimation(2)Growth of AlN on sapphire by metalorganic vapor phase epitaxy (MOVPE) at high temperature, and(3)Fabrication of high quality AlGaN-based quantum structure and UV emitting deviceIn 2003, custom designed MOVPE reactor which is capable of raising temperature as high as 1,800□ was installed and operated with the cooperation of Ibiden Co.,Ltd. Sublimation growth of AlN on SiC and spontaneous nucleation was performed. In 2004, world's shortest wavelength laser diode on sapphire was successfully fabricated on epitaxially lateral overgrown (ELO) low dislocation density AlGaN. High quality and thick AlN was grown on sapphire by high temperature MOVPE. In 2005, we successfully grow low dislocation density AlN on sapphire using ELO technique with a dislocation density as low as 10^7cm^<-2> or less.
期刊论文(54)
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H.Amano, S.Takanami, M.Iwaya, S.Kamiyama, I.Akasaki: "Group-III Nitride-Based UV-Light Emitting Devices"Phys.Stat.Sol.(a). 195. 491-495 (2003)
H.Amano、S.Takanami、M.Iwaya、S.Kamiyama、I.Akasaki:“III 族氮化物基紫外发光器件”Phys.Stat.Sol.(a)。
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通讯作者:
E.Valcheva, T.Paskova, G.Z.Radnoczi, L.Hultman, B.Monemar, H.Amano, I.Akasaki: "Growth-induced defects in AlN/GaN superlattices with different periods"PHYSICA B. 340-342. 1129-1132 (2003)
E.Valcheva、T.Paskova、G.Z.Radnoczi、L.Hultman、B.Monemar、H.Amano、I.Akasaki:“不同周期的 AlN/GaN 超晶格中的生长诱导缺陷”PHYSICA B. 340-342。
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Growth of high-quality AlN with high growth rate by high-temperature MOVPE
利用高温MOVPE高生长率生长高质量AlN
DOI: --
发表时间: 2006
期刊: Physica.Status Solidi (c) 3
影响因子: --
作者: [N.Fujimoto, T.Kitano, G.Narita, N.Okada, K.Balakrishnan, M.Iwaya, S.Kamiyama, H.Amano, I.Akasaki, K.Shimono, T.Noro, T.Takagi, A.Bandoh]
通讯作者: A.Bandoh
窒化物系化合物半導体の製造方法
氮化物基化合物半导体的制造方法
DOI: --
发表时间: 2005
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通讯作者:
20
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    • 批准号:
      25000011
    • 项目类别:
      Grant-in-Aid for Specially Promoted Research
    • 资助金额:
      $233.29万
    • 财政年份:
      2013
    • 负责人:
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    • 批准号:
      22246004
    • 项目类别:
      Grant-in-Aid for Scientific Research (A)
    • 资助金额:
      $31.53万
    • 财政年份:
      2010
    • 负责人:
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    • 批准号:
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    • 资助金额:
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    • 财政年份:
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