Position control of InAs quantum dots by using AFM oxidation method and application to single electron transistor
AFM氧化法InAs量子点位置控制及其在单电子晶体管中的应用
基本信息
- 批准号:13450124
- 负责人:
- 金额:$ 7.49万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for Scientific Research (B)
- 财政年份:2001
- 资助国家:日本
- 起止时间:2001 至 2003
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
In recent years the Research, which is going to develop the quantum effect, devices, such as single electronic transistors (SETs), is actively made by improvement in semiconductor ultra-fine processing technology. The specific "self-organization" phenomenon which carries out self-formation of the detailed structure very much attracts attention by distortion by the difference in the lattice constant of a material composition atom in recent years as processing technology which complements the ultra-fine processing technology using the ion beam, the electronic beam, etc. as a means to produce those devices.However, InAs quantum dots (QDs) has indispensable position contrl of each dots which carried out self-organization growth, in order for a large number to grow at rapdom, and apply to a single electron device. Then, in this research, it gazed at the application to a single electron device, and the technique of performing anode oxidization using the atomic force microscope (AFM) which we have developed by present was used.First, InAs QDs were grown up by using molecular beam epitaxy (MBE) method, and QD's density is decreased and migration was tried. Decreased density was raised by 40 degrees to 70 degrees from the substrate temperature in the state where the InAs QDs was grown up. It has figured out that decreased density, when the QDs migrated theoretically and dots join together or evaporated.Next, position control of InAs QDs were tried by performing detailed processing on a GaAs substrate by using the AFM oxidation, producing a nano-template, growing up InAs QDs and carrying out in-situ annealing on it.Consequently, the phenomenon which an InAs quantum dot moves to the nano-hole which migrated by in-situ annealing, and which was processed by the AFM oxidation has been figured out.
近年来,随着半导体超精细加工技术的发展,半导体单电子晶体管(SETS)等器件正积极地发展量子效应的研究。近年来,通过材料组成原子晶格常数的差异进行自组织形成的特殊的“自组织”现象引起了人们的极大关注,作为利用离子束、电子束等作为制造这些器件的手段的超精细加工技术的补充。然而,InAs量子点(QD)对进行自组织生长的每个点都有不可或缺的位置控制,以便大量的量子点快速生长,并应用于单个电子器件。然后,在本研究中,着眼于在单电子器件中的应用,使用了我们目前开发的原子力显微镜(AFM)进行阳极氧化的技术。首先,用分子束外延(MBE)方法生长了InAs量子点,降低了量子点的密度,并进行了迁移。在生长InAs量子点的状态下,降低的密度从衬底温度提高了40度到70度。在此基础上,利用原子力显微镜氧化技术对衬底进行精细加工、制备纳米模板、生长InAs量子点并对其进行原位热处理,从而实现了InAs量子点的位置控制,从而解决了InAs量子点向经过AFM氧化处理的纳米空穴移动的现象。
项目成果
期刊论文数量(22)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
Yuichi MATSUZAKI: "Improvement in Aspect Ration of P-GaAs Oxide Fabrication by Atomic Force Microscope (AFM)-Based Nanolithography Using Pulsed Voltage"Japanese Journal of Applied Physics. 40[6B]. 4327-4325 (2001)
Yuichi MATSUZAKI:“使用脉冲电压通过基于原子力显微镜 (AFM) 的纳米光刻技术改进 P-GaAs 氧化物制造的纵横比”日本应用物理学杂志。
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Yuichi Matsuzaki, Narihisa Ota, Akira Yamada, Makoto Konagai: "Formation of Nano-oxide Regions in p^<2+>-GaAs Epilayers by Localized Atomic Force Microscope Probe Oxidation for Fabrication of Nano-structure Device 2002 International Conference on Molecula
Yuichi Matsuzaki、Narihisa Ota、Akira Yamada、Makoto Konagai:“通过局域原子力显微镜探针氧化在 p^<2>-GaAs 外延层中形成纳米氧化物区域,用于制造纳米结构器件 2002 年国际分子会议
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Yuichi Matsuzaki: "Nanofabrication of Heavily Carbon Doped p-type GaAs by Atomic Force Microscope Nano-Oxidation Process and Its Application to Single Hole Transistors"Proceeding of 2002 International Conference on Molecular Beam Epitaxy. 155-156 (2002)
Yuichi Matsuzaki:“通过原子力显微镜纳米氧化工艺纳米制造重碳掺杂p型GaAs及其在单孔晶体管中的应用”2002年国际分子束外延会议论文集。
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Yuichi MATSUZAKI: "Improvement in Aspect Ration of P-GaAs Oxide Fabrication by Atomic Force Microscope (AFM)-Based Nanolithography Using Pulsed Voltage"Japanese Journal of Applied Physics. 40[6B]. 4325-4327 (2001)
Yuichi MATSUZAKI:“使用脉冲电压通过基于原子力显微镜 (AFM) 的纳米光刻技术改进 P-GaAs 氧化物制造的纵横比”日本应用物理学杂志。
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Yuichi MATSUZAKI, Shigeki HASUI, Shin-ya KAMADA, Akira YAMADA, Makoto KONAGAI: "Improvement in Aspect Ration of P-GaAs Oxide Fabrication by Atomic Force Microscope (AFM)-Based Nanolithography Using Pulsed Voltage"Japanese Journal of Applied Physics. 40[6B
Yuichi MATSUZAKI、Shigeki HASUI、Shin-ya KAMADA、Akira YAMADA、Makoto KONAGAI:“通过使用脉冲电压的原子力显微镜 (AFM) 纳米光刻技术改进 P-GaAs 氧化物制造的纵横比”日本应用物理学杂志。
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KONAGAI Makoto其他文献
KONAGAI Makoto的其他文献
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{{ truncateString('KONAGAI Makoto', 18)}}的其他基金
Development of High Efficiency Thin-Substrate Silicon Solar Cells with Controlled Nano-Interface
具有受控纳米界面的高效薄基板硅太阳能电池的开发
- 批准号:
22246001 - 财政年份:2010
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
Study of Novel Silicon Heterojunction Solar Cells with Controlled Fixed Charge
新型可控固定充电硅异质结太阳能电池的研究
- 批准号:
19206001 - 财政年份:2007
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
Research of Epitaxial Growth and Electrical Analysis of Si-Ge-C Layer
Si-Ge-C层外延生长及电学分析研究
- 批准号:
10450114 - 财政年份:1998
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Development of nanofabrication technology of metallic p-GaAs and its application to single hole transistors
金属p-GaAs纳米加工技术进展及其在单孔晶体管中的应用
- 批准号:
10555101 - 财政年份:1998
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for Scientific Research (B).
Study of Nitrogen Doping of ZnSe by Catalysis of Transition Metals
过渡金属催化ZnSe氮掺杂研究
- 批准号:
06452109 - 财政年份:1994
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for General Scientific Research (B)
Study OF Ultra-High Speed Heterojunction Bipolar Transistors with a Heavily Carbon-Doped Base
重碳掺杂基极超高速异质结双极晶体管的研究
- 批准号:
04555066 - 财政年份:1992
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for Developmental Scientific Research (B)
Control of the arrangement of native vacancies and optical in III-VI compound semiconductors
III-VI族化合物半导体中原生空位和光学排列的控制
- 批准号:
04452088 - 财政年份:1992
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for General Scientific Research (B)
Investigation of Heterojunction Bipolar Transistors Using Metallic P-Type Base Layer
使用金属 P 型基层的异质结双极晶体管的研究
- 批准号:
01460136 - 财政年份:1989
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for General Scientific Research (B)
Development of Low-Temperature Epitaxy of Silicon by Photo-Chemical Vapor Deposition
光化学气相沉积硅低温外延技术的进展
- 批准号:
62850053 - 财政年份:1987
- 资助金额:
$ 7.49万 - 项目类别:
Grant-in-Aid for Developmental Scientific Research
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