Atomic Force Microscopy in Nanoplastics Research

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Plastic particles of submicrometer size (nanoplastic particles, NPs) are meanwhile omnipresent in the environment, whereby the effects of those particles on different ecological systems and the associated risks are still largely unknown. Due to their small spatial dimensions, the identification/characterization of NPs represents a major experimental challenge. Furthermore, there is currently no established methodology for the systematic investigation of the interactions of NPs under relevant environmental conditions. In this context, atomic force microscopy is a promising methodology, which can be used to determine the size, shape, roughness, and possible agglomerations of NPs by means of an imaging procedure. In addition to imaging, the sharp and local probe of the microscope can also be used to investigating nanoscale mechanical, adhesive, and friction properties. However, this considerable potential has not yet been fully exploited for the characterization of NPs. Consequently, there is currently no scientifically verified basis for a comprehensive assessment of the performance of atomic force microscopy in NPs research. Within the scope of this project, atomic force microscopy will be applied systematically and automatically for the characterization of NPs. The main goal is to carry out statistically significant measurement series, which allow the scientific evaluation of the potential of atomic force microscopy in the field of nanoplastics research. Moreover, the ability of the atomic force microscope to investigate the interactions of NPs in relevant environments in-situ will be evaluated. For this purpose, scanning probes are decorated with NPs and their interactions are thoroughly studied under variation of environmental conditions.