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Reliable Assembling of Colloidal Nanoparticles in Two and Three Dimensions by Dual-AFM-based Handling inside a Scanning Electron Microscope

Reliable Assembling of Colloidal Nanoparticles in Two and Three Dimensions by Dual-AFM-based Handling inside a Scanning Electron Microscope
通过在扫描电子显微镜内基于双 AFM 的处理实现二维和三维胶体纳米颗粒的可靠组装
批准号:
213422375
负责人:
Professor Dr.-Ing. Sergej Fatikow
金额:
$0.0万
依托单位国家:
德国
项目类别:
Research Grants
财政年份:
2012
资助国家:
德国
项目状态:
已结题
起止时间:
2011-12-31 至 2019-12-31

项目摘要

项目成果

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中文摘要
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英文摘要
Colloidal particles provide a variety of micro- and nanosized particle systems in terms of chemical and physical properties. If individual colloidal particles are arranged in specific spatial order, they can collectively interact electronically or with incident light waves, enabling novel applications for photonics, plasmonics or sensors. This extension project aims to develop automated robotic procedures for the pick-and-place handling as well as the assembly of individual colloidal particles.To achieve this goal, a nanorobotic work station will be optimized in order to allow for precise and fully-automated assembly routines. Applying the well-known adhesion-guided handling strategies, an essential goal of this project is to evaluate the fundamental limits of the robotic based pick-and-place process, particularly with respect to progressively smaller particles. Furthermore, this extension project aims to develop automated packaging sequences of colloidal particles to assemble three-dimensional structures. Finally, the developed routines will be applied to fabricate functional photonic and plasmonic devices. These devices will be characterized with respect to the achievable geometric precision as well as to their electronic and optical properties in cooperation with other research groups from the field of nanophotonics and nano-optics.
期刊论文(5)
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会议论文
DOI: 10.1021/acsphotonics.6b00812
发表时间: 2017-02
期刊: ACS Photonics
影响因子: 7
作者: [J. Vogt;S. Zimmermann;C. Huck;M. Tzschoppe;F. Neubrech;S. Fatikow;A. Pucci]
通讯作者: J. Vogt;S. Zimmermann;C. Huck;M. Tzschoppe;F. Neubrech;S. Fatikow;A. Pucci
DOI: 10.1109/iros.2014.6942665
发表时间: 2014-11
期刊: 2014 IEEE/RSJ International Conference on Intelligent Robots and Systems
影响因子: --
作者: [Tobias Tiemerding;S. Zimmermann;S. Fatikow]
通讯作者: Tobias Tiemerding;S. Zimmermann;S. Fatikow
DOI: 10.1109/tmech.2014.2361271
发表时间: 2015-10-01
期刊: IEEE-ASME TRANSACTIONS ON MECHATRONICS
影响因子: 6.4
作者: [Zimmermann, Soeren, Tiemerding, Tobias, Fatikow, Sergej]
通讯作者: Fatikow, Sergej
DOI: 10.1109/nems.2016.7758248
发表时间: 2016-04
期刊: 2016 IEEE 11th Annual International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)
影响因子: --
作者: [Waldemar Klauser;S. Zimmermann;M. Bartenwerfer;S. Fatikow]
通讯作者: Waldemar Klauser;S. Zimmermann;M. Bartenwerfer;S. Fatikow
Fast Broadband Scanning Microwave Microscopy (FABSMM)
Ultra Small Surface Force Measurements in Vacuum
Liquid Contact Probing inside the SEM
Scanning Probe Processing of 2D Materials
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