STUDY OF ULTRA-THIN-FILM/ULTRA-FINE-STRUCTURE DEVEICES
超薄膜/超细结构器件的研究
基本信息
- 批准号:08044134
- 负责人:
- 金额:$ 6.4万
- 依托单位:
- 依托单位国家:日本
- 项目类别:Grant-in-Aid for international Scientific Research
- 财政年份:1996
- 资助国家:日本
- 起止时间:1996 至 1997
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
1.Silicon quantum dots with size less than 10nm were prepared by plasma processes. Uniform dot size was obtained based on the idea of the separation of nucleation and crystal growth using pulsed gas methods and understanding of the crystal growth mechanisms. Oxidation of nanocrystalline silicon was also investigated.2.Ultrasmall-gap polisilicon electrodes were fabricated by electron beam lithography and electron cyclotron resonance plasma reactive ion etching methods. 10-20nm gap electrodes were successfully prepared by the two-step exposere method. Single electron transport characteristics were observed in samples with deposited nanocrystalline silicon.3.Ultrathin films of oxide superconductors and insulator heterostructures were prepared by the atomic layr metalorganic chemical vapor deposition method. Reproducibility of thinfilms gabrication was enhanced by using in situ monitoring based on ultrasonic transducers and spectroscopic ellisonetry.4.Superconducting field effect was enhanced by the combination of Josephson junctions and planar type devices.5.Anomolous current voltage characteristics due to intrinsic Josephson junctions were observed in YBCO thinfilm deveices fabricated by scanning probe microscopy lithography.6.Atomic layr epitaxy of silicon on Si (100) was investigated. Self-limiting growth conditions were clarified on the basis of formation of SiHCl due to reaction in the gas phase.
1.采用等离子体法制备了尺寸小于10 nm的硅量子点。基于脉冲气体法的成核和晶体生长分离的思想和对晶体生长机理的理解,获得了均匀的点尺寸。采用电子束光刻和电子回旋共振等离子体反应离子刻蚀技术制备了超小间隙多晶硅电极。采用两步烧结法成功地制备了10- 20 nm间隙电极。在沉积了纳米晶硅的样品中观察到了单电子输运特性。3.用原子层金属有机化学气相沉积法制备了氧化物超导体和绝缘体异质结构的超薄膜。利用基于超声换能器的原位监测技术和光谱分析技术,提高了薄膜的重复性。4.约瑟夫森结和平面型器件的结合增强了超导场效应。5.在用扫描探针显微镜光刻法制备的YBCO薄膜器件中,观察到了由于本征约瑟夫森结引起的反常电流-电压特性。6.在Si上原子层外延Si(100)进行了调查。自限性生长条件的基础上,澄清由于在气相中的反应形成的SiHCl。
项目成果
期刊论文数量(209)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
A.Dutta, M.Kimura, Y.Honda, M.Otobe, A,Itoh and S.Oda: "Fabrication and Electrical Charcteristics of Single Electron Tunneling Devices Based on Si Quantum Dots Prepared by Plasma Processing" Japanese Journal of Applied Physics. 36. 4038-4041 (1997)
A.Dutta、M.Kimura、Y.Honda、M.Otobe、A、Itoh 和 S.Oda:“基于等离子体处理制备的硅量子点的单电子隧道器件的制造和电气特性”日本应用物理学杂志。
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- 影响因子:0
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- 通讯作者:
T.Ifuku, M.Otobe, A.Itoh and S.Oda: "Fabrication of Nanocrystalline Silicon with Small Spread of Particle Size by Pulsed Gas Plasma" Japanese Journal of Applied Physics. 36. 4031-4034 (1997)
T.Ifuku、M.Otobe、A.Itoh 和 S.Oda:“通过脉冲气体等离子体制造具有小粒径分布的纳米晶硅”日本应用物理学杂志。
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- 影响因子:0
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M.Matsumura and A.Saitoh: "Amorphous-Silicon Thin-Film Transistors Matchedto Ultra-Large Panels" Materials Research Society Symposium Proceedings. (in press). (1997)
M.Matsumura 和 A.Saitoh:“与超大型面板匹配的非晶硅薄膜晶体管”材料研究学会研讨会论文集。
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- 影响因子:0
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K.Choi, Y.UChida and M.Matsumura: "Excimer-Laser Crystallization of Silicon-Carbon Films and Their Thin-Film Transistor Application" Japanese Journal of Applied Physics. 35-3. 1648-1651 (1996)
K.Choi、Y.UChida 和 M.Matsumura:“硅碳薄膜的准分子激光结晶及其薄膜晶体管应用”日本应用物理学杂志。
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- 影响因子:0
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R Ji,S F Yoon,J Ahn and W I Milne: "Some effects of P dopingin SiC:H Films prepared by ECR-CVD" Materials Science and Engineering B-Solid State Materials for Advanced Technology. 148-3. 215 (1997)
R Ji、S F Yoon、J Ahn 和 W I Milne:“P 掺杂对 ECR-CVD 制备的 SiC:H 薄膜的一些影响”材料科学与工程 B-先进技术固态材料。
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- 影响因子:0
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{{ truncateString('ODA Shunri', 18)}}的其他基金
Fabrication of Nanoscale Devices and Circuits using DNA Origami Technology
使用 DNA 折纸技术制造纳米级器件和电路
- 批准号:
24656201 - 财政年份:2012
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Challenging Exploratory Research
Precise position control of silicon quantum dots and fabrication of quantum information devices.
硅量子点的精确位置控制和量子信息器件的制造。
- 批准号:
22246040 - 财政年份:2010
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
Integrated Assembly of NeoSilicon towards Quantum Information Devices
NeoSilicon 面向量子信息器件的集成组装
- 批准号:
19206035 - 财政年份:2007
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
Self-assembled integration technologies of silicon quantum dots toward future NeoSilicon quantum information devices
面向未来NeoSilicon量子信息器件的硅量子点自组装集成技术
- 批准号:
16206030 - 财政年份:2004
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
Atomic scale control of high-k dielectric ultrathin film grown by atomic layer-by-layer MOCVD with using in situ spectroscopic ellipsometry monitoring
利用原位光谱椭偏监测对原子逐层 MOCVD 生长的高 k 介电超薄膜进行原子尺度控制
- 批准号:
14350160 - 财政年份:2002
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Control of Particle Size and Position of Nano-crystalline Silicon
纳米晶硅颗粒尺寸和位置的控制
- 批准号:
11450008 - 财政年份:1999
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (B)
Single Electron Devices Based on NeoSilicon Materials
基于新硅材料的单电子器件
- 批准号:
11355014 - 财政年份:1999
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
STUDY OF ULTRA-THIN-FILM/ULTRA-FINE-STRUCTURE DEVICES
超薄膜/超细结构器件的研究
- 批准号:
10044138 - 财政年份:1998
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (A).
Fabnication of Superconductor/Insulator/Superconductor Trilayer Tunnel Junction Devices by Atomic Layer MOCVD
原子层MOCVD制备超导/绝缘体/超导三层隧道结器件
- 批准号:
08555004 - 财政年份:1996
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for Scientific Research (A)
Study of Ultra-Thin-Film/Ultra-Fine-Structure Devices
超薄膜/超微细结构器件的研究
- 批准号:
06044076 - 财政年份:1994
- 资助金额:
$ 6.4万 - 项目类别:
Grant-in-Aid for international Scientific Research
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