STUDY OF ULTRA-THIN-FILM/ULTRA-FINE-STRUCTURE DEVEICES
STUDY OF ULTRA-THIN-FILM/ULTRA-FINE-STRUCTURE DEVEICES
批准号:
08044134
负责人:
ODA Shunri
金额:
$6.4万
依托单位国家:
日本
项目类别:
Grant-in-Aid for international Scientific Research
财政年份:
1996
资助国家:
日本
项目状态:
已结题
起止时间:
1996 至 1997
中文摘要
1.采用等离子体法制备了尺寸小于10 nm的硅量子点。基于脉冲气体成核和晶体生长分离的思想和对晶体生长机理的理解,得到了均匀的网点尺寸。采用电子束曝光法和电子回旋共振等离子体反应离子刻蚀法制备了小间隙超声波硅电极。采用两步曝光法制备了10-20 nm间隙电极。用原子层金属有机化学气相沉积方法制备了氧化物超导体和绝缘体异质结构的超薄膜。基于超声换能器和光谱分析的在线监测技术提高了薄膜制备的重复性。4.约瑟夫森结和平面型器件的结合增强了超导电场效应。5.在扫描探针显微镜光刻制备的YBCO薄膜器件中观察到了由本征约瑟夫森结引起的各种电流电压特性。6.研究了硅在Si(100)衬底上的原子层外延。在气相反应生成SiHCl的基础上,阐明了自限生长条件。
英文摘要
1.Silicon quantum dots with size less than 10nm were prepared by plasma processes. Uniform dot size was obtained based on the idea of the separation of nucleation and crystal growth using pulsed gas methods and understanding of the crystal growth mechanisms. Oxidation of nanocrystalline silicon was also investigated.2.Ultrasmall-gap polisilicon electrodes were fabricated by electron beam lithography and electron cyclotron resonance plasma reactive ion etching methods. 10-20nm gap electrodes were successfully prepared by the two-step exposere method. Single electron transport characteristics were observed in samples with deposited nanocrystalline silicon.3.Ultrathin films of oxide superconductors and insulator heterostructures were prepared by the atomic layr metalorganic chemical vapor deposition method. Reproducibility of thinfilms gabrication was enhanced by using in situ monitoring based on ultrasonic transducers and spectroscopic ellisonetry.4.Superconducting field effect was enhanced by the combination of Josephson junctions and planar type devices.5.Anomolous current voltage characteristics due to intrinsic Josephson junctions were observed in YBCO thinfilm deveices fabricated by scanning probe microscopy lithography.6.Atomic layr epitaxy of silicon on Si (100) was investigated. Self-limiting growth conditions were clarified on the basis of formation of SiHCl due to reaction in the gas phase.
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A.Dutta, M.Kimura, Y.Honda, M.Otobe, A,Itoh and S.Oda: "Fabrication and Electrical Charcteristics of Single Electron Tunneling Devices Based on Si Quantum Dots Prepared by Plasma Processing" Japanese Journal of Applied Physics. 36. 4038-4041 (1997)
A.Dutta、M.Kimura、Y.Honda、M.Otobe、A、Itoh 和 S.Oda:“基于等离子体处理制备的硅量子点的单电子隧道器件的制造和电气特性”日本应用物理学杂志。
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T.Ifuku, M.Otobe, A.Itoh and S.Oda: "Fabrication of Nanocrystalline Silicon with Small Spread of Particle Size by Pulsed Gas Plasma" Japanese Journal of Applied Physics. 36. 4031-4034 (1997)
T.Ifuku、M.Otobe、A.Itoh 和 S.Oda:“通过脉冲气体等离子体制造具有小粒径分布的纳米晶硅”日本应用物理学杂志。
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M.Matsumura and A.Saitoh: "Amorphous-Silicon Thin-Film Transistors Matchedto Ultra-Large Panels" Materials Research Society Symposium Proceedings. (in press). (1997)
M.Matsumura 和 A.Saitoh:“与超大型面板匹配的非晶硅薄膜晶体管”材料研究学会研讨会论文集。
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K.Choi, Y.UChida and M.Matsumura: "Excimer-Laser Crystallization of Silicon-Carbon Films and Their Thin-Film Transistor Application" Japanese Journal of Applied Physics. 35-3. 1648-1651 (1996)
K.Choi、Y.UChida 和 M.Matsumura:“硅碳薄膜的准分子激光结晶及其薄膜晶体管应用”日本应用物理学杂志。
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R Ji,S F Yoon,J Ahn and W I Milne: "Some effects of P dopingin SiC:H Films prepared by ECR-CVD" Materials Science and Engineering B-Solid State Materials for Advanced Technology. 148-3. 215 (1997)
R Ji、S F Yoon、J Ahn 和 W I Milne:“P 掺杂对 ECR-CVD 制备的 SiC:H 薄膜的一些影响”材料科学与工程 B-先进技术固态材料。
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共 195 条
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Atomic scale control of high-k dielectric ultrathin film grown by atomic layer-by-layer MOCVD with using in situ spectroscopic ellipsometry monitoring
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财政年份:1999
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依托单位:
STUDY OF ULTRA-THIN-FILM/ULTRA-FINE-STRUCTURE DEVICES
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批准号:10044138
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财政年份:1998
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依托单位:
Fabnication of Superconductor/Insulator/Superconductor Trilayer Tunnel Junction Devices by Atomic Layer MOCVD
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财政年份:1996
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负责人:ODA Shunri
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依托单位:
Study of Ultra-Thin-Film/Ultra-Fine-Structure Devices
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批准号:06044076
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项目类别:Grant-in-Aid for international Scientific Research
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财政年份:1994
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Study of Ultra-Thin-Film/Ultra-Fine-Structure Devices
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依托单位:
海外基金