Ion/Atom/Electron Surface Dynamics Using Experimental Coincidence-Correlation Techniques and Theoretical Analysis

休斯顿大学的拉巴莱教授与拉马尔大学的巴赫里姆教授合作，正在开发离子表面散射分析方法，用于对表面进行详细的结构和成分分析。在分析和表面化学计划的支持下，该团队正在开发专注于离子-电子符合和离子散射光谱中的关联的实验和计算方法。利用电子波包传输分析，结合详细的符合谱，发展了一种用于表面分析的电荷转移显微镜。这项工作的更广泛的影响在于，这些方法在半导体加工工业中以及在催化和腐蚀应用中的技术表面分析中都很有用。拉巴莱和他的同事正在使用电子-离子符合光谱学，结合详细的理论分析，开发表面结构和成分分析的方法。这种独特的方法提供了关于离子表面散射过程的新的详细程度，并使获得新的结构和成分信息成为可能。这种关于离子表面散射的基本机制信息在许多工业环境中都有应用，从半导体加工到多相催化。

AbstractCHE-0608851Rabalais/HoustonProfessor Rabalais at the University of Houston, in collaboration with Professor Bahrim at Lamar University, is developing ion surface scattering analytical methods for the detailed structural and compositional analysis of surfaces. With the support of the Analytical and Surface Chemistry Program, this team is developing experimental and computational methods focused on ion-electron coincidence and correlation in ion scattering spectrometry. Electron wave packet propagation analysis, combined with detailed coincidence spectra, is used to develop a charge transfer microscopy for the analysis of surfaces. The broader impact of this work lies in the fact that these methods are useful in the semiconductor process industry as well as broadly in the analysis of technological surfaces in catalysis and corrosion applications. Rabalais and coworkers are using electron-ion coincidence spectroscopy, coupled with detailed theoretical analysis, to develop methods for the structural and compositional analysis of surfaces. This unique approach provides a new level of detail about the ion-surface scattering process, and enables a new level of structural and compositional information to be obtained. This fundamental mechanistic information about ion-surface scattering finds application in a number of industrial settings, ranging from semiconductor processing to heterogeneous catalysis.