Light Element Analysis Facility - LEAF

电子显微镜倾向于分析较重的元素；然而，较轻的元素往往起着关键作用。此外，在软物质和有机材料中，通常只有轻元素存在。随着新技术的出现，以更高的精度分析轻元素已成为可能。我们请求支持在我们的跨学科电子显微镜中心安装一个新的轻元素分析设施，以补充现有设备(2台透射电子显微镜、1台FIB和2台扫描电子显微镜)。我们建议在现有电子显微镜设施的基础上增加一台电子探针显微分析仪(EPMA)、一台独立的软X射线发射光谱仪(SXES)系统和一台共焦拉曼显微镜。这将使我们能够探索从元素Li到O甚至更远的地方，提供详细的成分、电子和空间分析，以支持一系列关键主题的研究。

Electron Microscopy tends to focus upon analysis of the heavier elements; however the lighter elements often have a critical role to pay. Furthermore, in soft matter and organic materials, it is ofteny only light elements that are present. With the advent of new technologies, it has become possible to analyse for light elements with much greater precision. We are requesting support for a new light element analysis facility to be housed in our interdisciplinary Electron Microscopy Centre complementing the existing equipment (2 TEM's, a FIB and 2 SEM's). We propose to build upon our existing Electron Microscopy facilities by adding an electron probe microanalyser (EPMA), a separate Soft X-ray Emission Spectrometer (SXES) system and a confocal Raman microscope. This will allow us to probe from elemental Li up to O and beyond, giving detailed compositional, electronic and spatial analysis to support research in a range of critical topics.