Testability and Sequential Optimization of Asynchronous State Machines

这项研究是一个长期的努力的一部分，同步设计的技术迁移到异步设计。 这两个重点领域是顺序优化和综合的可测试性。 在前者中，正在研究输入、输出和输入/输出编码的问题公式。 在每种情况下，最优性，无竞争编码和无风险逻辑的问题正在同时解决。 在后者中，正在追求使用部分扫描或不扫描的完全可测试的异步状态机的合成。 设计工具，结合优化和综合测试的算法，正在开发中。

This research is part of a long term effort to migrate techniques for synchronous design to asynchronous design. The two focus areas are sequential optimization and synthesis for testability. In the former, problem formulations of input, output and input/output encoding are being investigated. In each case, the problems of optimality, race-free encoding, and hazard free logic are being solved simultaneously. In the latter, synthesis of fully testable asynchronous state machines using partial or no scan is being pursued. Design tools, incorporating the algorithms for optimization and synthesis for test, are being developed.