MRI: Advanced Processing Equipment for Microelectronics Research
MRI:用于微电子研究的先进处理设备
基本信息
- 批准号:9871290
- 负责人:
- 金额:$ 38.6万
- 依托单位:
- 依托单位国家:美国
- 项目类别:Standard Grant
- 财政年份:1998
- 资助国家:美国
- 起止时间:1998-09-01 至 2002-08-31
- 项目状态:已结题
- 来源:
- 关键词:
项目摘要
9871290 Gangopadhyay The proposed equipment purchase will be a major part of a broad interdisciplinary research initiative at Texas Tech University (TTU), aimed at the fabrication and characterization of semiconductor materials. Within this larger research theme, the equipment will support work in two major focus areas-silicon processing and compound semiconductors-as well as in process modeling. The research effort in these areas at TTU is progressing with high levels of private sector partnership. Both graduate and undergraduate students are actively involved in this work. In addition to research, the equipment will be used for education and training of students in two graduate programs--the Master's Program with Internship (MSI) in the College of Arts and Sciences, and the Master's Program in Semiconductor Product Engineering (SPE) in the College of Engineering. The MSI program is an NSF-supported curriculum. The required nine to twelve months of internship are supported by major semiconductor manufacturers. The SPE program is entirely supported by major semiconductor companies. In this proposal the PIs request funding for one system. This system is a modem R&D cluster tool that will allow them to significantly improve and expand the range of etching and deposition processes needed in their research effort. The cluster tool consists of two electron cyclotron resonance (ECR) plasma chambers, one for large area (6-8 inch wafers) deposition and the other for etching. This instrument is manufactured by PlasmaQuest. This company has been selected for a number of reasons. Their equipment suits our needs and their prices are very competitive. More importantly, PlasmaQuest products are used by our industrial collaborators at Texas Instruments and Raytheon. Compatibility of equipment is important in joint process development and the subsequent technology transfer. It is also important in our student-training activities, including industrial co-ops and mentoring. Finally, PlasmaQue st has an excellent reputation for developing various processes for microelectronics in collaboration with university and industry researchers, and is known for encouraging dissemination of the results. The equipment requested will have a major impact on research activities in Si and compound semiconductors. While the two research areas appear quite separate there are in fact a number of synergies. For instance, deposition of AIN on Si appears to be of interest both to the compound semiconductors and Si communities. Similarly, low damage etching of GaN would not he possible without the expertise developed in the etching of Si. While equipment sharing rises the possibility of cross-contamination, they believe both research areas will benefit. their modeling work is relevant to both semiconductor programs. The goal of this effort is to develop reliable numerical simulations of etching and deposition, which are then to be used in process analysis, design, and control. ***
拟议的设备采购将是德克萨斯理工大学(TTU)广泛的跨学科研究计划的主要部分,旨在制造和表征半导体材料。在这个更大的研究主题中,该设备将支持两个主要重点领域的工作-硅加工和化合物半导体-以及过程建模。TTU在这些领域的研究工作正在与私营部门的高水平伙伴关系下取得进展。研究生和本科生都积极参与这项工作。除了研究之外,这些设备还将用于教育和培训两个研究生项目的学生——艺术与科学学院的硕士实习项目(MSI)和工程学院的半导体产品工程硕士项目(SPE)。MSI项目是nsf支持的课程。所需的9到12个月的实习由主要半导体制造商提供支持。SPE程序完全由主要半导体公司支持。在此提案中,pi要求为一个系统提供资金。该系统是一个现代化的研发集群工具,将使他们能够显着改善和扩大他们研究工作中所需的蚀刻和沉积工艺的范围。集束工具由两个电子回旋共振(ECR)等离子体室组成,一个用于大面积(6-8英寸晶圆)沉积,另一个用于蚀刻。该仪器由PlasmaQuest公司制造。这家公司被选中的原因有很多。他们的设备符合我们的需要,价格也很有竞争力。更重要的是,PlasmaQuest产品被我们在德州仪器和雷神公司的工业合作者使用。设备的兼容性在联合工艺开发和随后的技术转让中很重要。这在我们的学生培训活动中也很重要,包括工业合作社和指导。最后,PlasmaQue st在与大学和工业研究人员合作开发各种微电子工艺方面享有良好声誉,并以鼓励成果传播而闻名。所要求的设备将对硅和化合物半导体的研究活动产生重大影响。虽然这两个研究领域看起来相当独立,但实际上有许多协同作用。例如,在硅上沉积AIN似乎对化合物半导体和硅族都很感兴趣。同样,如果没有硅蚀刻技术的发展,氮化镓的低损伤蚀刻是不可能的。虽然设备共享增加了交叉污染的可能性,但他们认为两个研究领域都将受益。他们的建模工作与这两个半导体程序相关。这项工作的目标是开发可靠的蚀刻和沉积的数值模拟,然后用于工艺分析,设计和控制。***
项目成果
期刊论文数量(0)
专著数量(0)
科研奖励数量(0)
会议论文数量(0)
专利数量(0)
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Shubhra Gangopadhyay其他文献
Patterning Single Cell-Electrode Pairs for Electrochemical Measurement of Quantal Exocytosis on Microchips
- DOI:
10.1016/j.bpj.2008.12.440 - 发表时间:
2009-02-01 - 期刊:
- 影响因子:
- 作者:
Xin Liu;Syed Barizuddin;Cherian J. Mathai;Shubhra Gangopadhyay;Kevin D. Gillis - 通讯作者:
Kevin D. Gillis
Experimental characterization of optical nonlocality in metal-dielectric multilayer metamaterials.
金属电介质多层超材料中光学非定域性的实验表征。
- DOI:
10.1364/oe.22.022974 - 发表时间:
2014 - 期刊:
- 影响因子:3.8
- 作者:
Lei Sun;Fei Cheng;C. Mathai;Shubhra Gangopadhyay;Jie Gao;Xiaodong Yang - 通讯作者:
Xiaodong Yang
Molecularly imprinted polymer labeled with quantum dots for detection of nitroaromatic explosives
量子点标记的分子印迹聚合物用于检测硝基芳香族爆炸物
- DOI:
10.32469/10355/10244 - 发表时间:
2010 - 期刊:
- 影响因子:0
- 作者:
Shubhra Gangopadhyay - 通讯作者:
Shubhra Gangopadhyay
Experimental characterization of optical nonlocalities in metal-dielectric multilayer metamaterials
金属电介质多层超材料中光学非局域性的实验表征
- DOI:
- 发表时间:
2014 - 期刊:
- 影响因子:0
- 作者:
Changyu Hu;Jie Gao;C. Mathai;Shubhra Gangopadhyay;Xiaodong Yang - 通讯作者:
Xiaodong Yang
Low temperature crystallization of amorphous silicon carbide thin films for p–n junction devices fabrication
- DOI:
10.1007/s10854-007-9452-9 - 发表时间:
2007-11-08 - 期刊:
- 影响因子:2.800
- 作者:
Maruf Hossain;Minseong Yun;Venumadhav Korampally;Shubhra Gangopadhyay - 通讯作者:
Shubhra Gangopadhyay
Shubhra Gangopadhyay的其他文献
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{{ truncateString('Shubhra Gangopadhyay', 18)}}的其他基金
GOALI: Nanothermite Based Micro Shockwave Generators and Nanoparticles for Targeted and Efficient Gene/Drug Delivery
GOALI:基于纳米铝热剂的微型冲击波发生器和纳米颗粒,用于靶向高效的基因/药物递送
- 批准号:
0901566 - 财政年份:2009
- 资助金额:
$ 38.6万 - 项目类别:
Standard Grant
Collaborative Research: High Density Metal and Semiconductor Nanoparticles for Memory and Photonic Applications
合作研究:用于存储器和光子应用的高密度金属和半导体纳米颗粒
- 批准号:
0801753 - 财政年份:2008
- 资助金额:
$ 38.6万 - 项目类别:
Standard Grant
MRI: ACQUISITION OF A MULTI-FUNCTIONAL ELECTRON MICROSCOPE FOR STUDIES AT THE NANO/MICRO SCALE IN THE MATERIAL AND LIFE SCIENCES
MRI:购买多功能电子显微镜,用于材料和生命科学中纳米/微米尺度的研究
- 批准号:
0619607 - 财政年份:2006
- 资助金额:
$ 38.6万 - 项目类别:
Standard Grant
Collaborative Research: Advanced High Dielectric Constant Gate Materials for CMOS Devices
合作研究:用于 CMOS 器件的先进高介电常数栅极材料
- 批准号:
0400025 - 财政年份:2003
- 资助金额:
$ 38.6万 - 项目类别:
Continuing Grant
Collaborative Research: Advanced High Dielectric Constant Gate Materials for CMOS Devices
合作研究:用于 CMOS 器件的先进高介电常数栅极材料
- 批准号:
0223109 - 财政年份:2002
- 资助金额:
$ 38.6万 - 项目类别:
Continuing Grant
GOALI: New Dielectrics for Development of Metal to Metal Antifuse for FPGA
GOALI:用于开发 FPGA 金属对金属反熔丝的新型电介质
- 批准号:
9614593 - 财政年份:1997
- 资助金额:
$ 38.6万 - 项目类别:
Continuing Grant
New methods for the growth of carbon nitride
氮化碳生长的新方法
- 批准号:
9619256 - 财政年份:1996
- 资助金额:
$ 38.6万 - 项目类别:
Standard Grant
Novel Approaches for Deposition, Characterization and DeviceStudies of Carbon Nitride
氮化碳沉积、表征和器件研究的新方法
- 批准号:
9522129 - 财政年份:1995
- 资助金额:
$ 38.6万 - 项目类别:
Standard Grant
Characterization of Intrinsic and Doped Hydrogenated Amor phous Silicon Thin Films Produced by Microwave Discharges inToroidal and Linear Plasma Systems
环形和线性等离子体系统中微波放电产生的本征和掺杂氢化非晶硅薄膜的表征
- 批准号:
9011235 - 财政年份:1990
- 资助金额:
$ 38.6万 - 项目类别:
Standard Grant
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