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Formation of Si Quasi-Single Crystal by Controlled Excess Vacancy

Formation of Si Quasi-Single Crystal by Controlled Excess Vacancy
控制过量空位形成Si准单晶
批准号:
12450015
负责人:
MIYAO Masanobu
金额:
$9.47万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2000
资助国家:
日本
项目状态:
已结题
起止时间:
2000 至 2002

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中文摘要
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英文摘要
Low temperature solid-phase crystallization (SPC) of a-SiGe on SiO2 has been investigated. The crystal nucleation of a-Si occurred at temperatures above 700℃, while the nucleation temperature was significantly decreased to 500℃ by using a-SiGe and ion irradiation during SPC. It was also shown that local doping of Ge at the a-Si/Si02 interface could control crystal orientation during SPC. These new polycrystal line SiGe films on Si02 can be used for the system-in-display and three-dimensional ULSI.
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I. Tsunoda et al.: "Low-temperature solid-phase crystallization of a-Sil-XGeX ON SiO2 by ion-beam stimulation"Materials Science and Engineering B. Vol. 89. 336-340 (2002)
I. Tsunoda 等:“通过离子束刺激实现 a-Sil-XGeX ON SiO2 的低温固相结晶”材料科学与工程 B.卷。
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通讯作者:
M.Miyao et al.: "Ion-beam Stimulated Solid-phase Crystallization of Amorphous Si on SiO_2"Book of Abst.of European Materials Conference (E-MRS). O-8-O-8 (2000)
M.Miyao等人:“SiO_2上非晶硅的离子束刺激固相结晶”欧洲材料会议(E-MRS)摘要书。
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Y.Murakami et al.: "Dose Rate Dependence of Ion-Induced-Damage in Si Evaluated by Spectroscovic Ellipsometry"Solid State Phenomena. Vol.78-79. 341-344 (2001)
Y.Murakami 等人:“通过光谱椭圆偏振法评估硅中离子诱导损伤的剂量率依赖性”固态现象。
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