Study on active synthetic imaging method for microscope

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The present study has aimed to establish the theoretical background and the application of the newly proposed active synthetic imaging method, under the basis of the active image processing previously developed by authors.At the first stage(1990), basic theoretical studies on the active synthetic imaging method have been carried out using the concept of the 3D optical transfer function(3D OTF). And a prototype optical system has been constructed by attaching additional optical/mechanical parts to a conventional optical microscope. 3D power spectra of this prototype system have been measured using a newly developed 3D image acquisition/processing system. These results show that the 'synthesis' of the effective 3D OTF is truly possible. On the other hand, the 3D power spectra of the transmission electron microscope images have also been measured by using the 3D image acquisition/processing system. These spectra are the first observation in the field of the transmission electron microscop … More y. From these measurements, it has been also concluded that the active synthetic imaging method is well applicable in the transmission electron microscopy.Proposal and experiment of the spherical aberration free observation method have been done at the next stage(1991). This method is based on the moving defocus averaging as an application of the active synthetic imaging method. In addition to this, a prototype of the real time(2-4 TV frames rate)active synthetic imaging system has been constructed and successfully applied to the phase plate-less phase microscopy. On the other hand, the non-real time spherical aberration correction of defocus modulation type has also applied to a Hitachi HF-2000 transmission electron microscope. The experimental results show 1.6-1.7 times improvement of the resolution.From present studies, it is expected that the present active synthetic imaging method can be widely applied to both fields of the optical microscopy and the transmission electron microscopy. Less