Polarization study of molecules at surfaces by scanning probe method

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There has been a great progress in dynamic force microscopy(DFM) and the related techniques. Atomic force microscopy(AFM) has been proved to be a powerful tool for nondestructive, atomic-resolution imaging of various materials including organic molecules, which are often difficult to be investigated by scanning tunneling microscopy(STM). Some of AFM-based techniques such as Kelvin-probe force microscopy(KFM) are capable of investigating nanometer-scale electrical properties. In addition, AFM probe can basically enables us to directly access an object and to modify the structures and/or the properties. On the other hand, since electrical polarization or local electric field at the interface between molecules and a substrate are strongly related to electrical junction properties or ferroelectric domain formation, it is actually indispensable for understanding the physical origins of the interfacial polarization in the engineering aspect, especially in the application of the polarization control of molecules to the molecular electronics.In this project we demonstrated that evaluation and control of molecular polarization was performed by newly developed techniques, which were (1)high-resolution atomic force microscopy, (2)molecule deposition with precisely controlled molecular orientation and (3)nanoscale DFM-based measurement techniques for electrical properties of molecules.