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Preparation of Piezoelectric Thin Films with Nano domain Engineering

Preparation of Piezoelectric Thin Films with Nano domain Engineering
纳米域工程制备压电薄膜
批准号:
17360323
负责人:
FUNAKUBO Hiroshi
金额:
$9.47万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2005
资助国家:
日本
项目状态:
已结题
起止时间:
2005 至 2006

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中文摘要
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英文摘要
Piezoelectric films are very important component for MEMS applications. However, its piezoresponse was smaller than expected one from bulk materials. We found the giant piezoelectricity along {111} direction in MPB-composition PZT. In the present study, the purpose of the present study is the following issues.1.Investigation of the origin of the large piezoresponse.2.Investigation of the piezoresponse without PZT.As results, the following results were obtained.1)(100)-/(001)- oriented films with (100) volume fraction less than 50% was obtained. This film shows large d_<33> value of 400 and its origin is considered to be the domain switching.2)Pb(Mg_<1/3>Nb_<2/3>)O_3-PbTiO_3 [PMN-PT] films with large PT content were epitaxially grown. Phase change between tetragonal and rhombohedral phases was shifted in case of films. The PT content showing maximum piezoelectric response was found to be also changed.3)Pb(Zn_<1/3>Nb_<2/3>)O_3-PbTiO_3 [PZN-PT], which reported to show the maximum piezoresponse in bulk, was first succeeded in film form.
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Raman spectroscopic characterization of tetragonal Pb(Zr_xTi_<1-x>)O_3 thin films : A rapid evaluation method for c-domain volume
四方Pb(Zr_xTi_<1-x>)O_3薄膜的拉曼光谱表征:一种c域体积的快速评估方法
DOI: --
发表时间: 2005
期刊: Jpn.J.Appl.Phys. 44(24-27)
影响因子: --
作者: [K.Nishida, M.Osada, S.Wada, S.Okamoto, R.Ueno, H.Funakubo, T.Katoda]
通讯作者: T.Katoda
DOI: 10.1063/1.2337391
发表时间: 2006-09
期刊: Journal of Applied Physics
影响因子: 3.2
作者: [S. Yokoyama;S. Okamoto;H. Funakubo;T. Iijima;K. Saito;H. Okino;Takashi Yamamoto;K. Nishida]
通讯作者: S. Yokoyama;S. Okamoto;H. Funakubo;T. Iijima;K. Saito;H. Okino;Takashi Yamamoto;K. Nishida
Raman Spectroscopic Characterization of Tetragonal PbZrxTil-xO3 Thin Films : A Rapid Evaluation Method for c-Domain Volume,
四方 PbZrxTil-xO3 薄膜的拉曼光谱表征:c 域体积的快速评估方法,
DOI: --
发表时间: 2005
期刊: Jpn.J.Appl.Phys., 44(25)
影响因子: --
作者: [Ken Nishida, Minoru Osada, Syunsyuke Wada, Shoji Okamoto, Risako Ueno, Hiroshi Funakubo, Takashi Katoda]
通讯作者: Takashi Katoda
Electric-Field-Induced Displacements in Pt/PZT/Pt/SiO_2/Si System Investigated by Finite Element Method : Material-Constant Dependences
通过有限元方法研究 Pt/PZT/Pt/SiO_2/Si 系统中电场引起的位移:材料常数依赖性
DOI: --
发表时间: 2006
期刊: Mater. Res. Soc. Symp. Proc. 902E
影响因子: --
作者: [H.Okino, M.Hayashi, T.Iijima, S.Yokoyama, H.Funakubo, N.Setter, T.Yamamoto]
通讯作者: T.Yamamoto
25
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