Preparation of Piezoelectric Thin Films with Nano domain Engineering
Preparation of Piezoelectric Thin Films with Nano domain Engineering
批准号:
17360323
负责人:
FUNAKUBO Hiroshi
金额:
$9.47万
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2005
资助国家:
日本
项目状态:
已结题
起止时间:
2005 至 2006
中文摘要
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英文摘要
Piezoelectric films are very important component for MEMS applications. However, its piezoresponse was smaller than expected one from bulk materials. We found the giant piezoelectricity along {111} direction in MPB-composition PZT. In the present study, the purpose of the present study is the following issues.1.Investigation of the origin of the large piezoresponse.2.Investigation of the piezoresponse without PZT.As results, the following results were obtained.1)(100)-/(001)- oriented films with (100) volume fraction less than 50% was obtained. This film shows large d_<33> value of 400 and its origin is considered to be the domain switching.2)Pb(Mg_<1/3>Nb_<2/3>)O_3-PbTiO_3 [PMN-PT] films with large PT content were epitaxially grown. Phase change between tetragonal and rhombohedral phases was shifted in case of films. The PT content showing maximum piezoelectric response was found to be also changed.3)Pb(Zn_<1/3>Nb_<2/3>)O_3-PbTiO_3 [PZN-PT], which reported to show the maximum piezoresponse in bulk, was first succeeded in film form.
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Raman spectroscopic characterization of tetragonal Pb(Zr_xTi_<1-x>)O_3 thin films : A rapid evaluation method for c-domain volume
四方Pb(Zr_xTi_<1-x>)O_3薄膜的拉曼光谱表征:一种c域体积的快速评估方法
DOI:
--
发表时间:
2005
期刊:
Jpn.J.Appl.Phys. 44(24-27)
影响因子:
--
作者:
[K.Nishida, M.Osada, S.Wada, S.Okamoto, R.Ueno, H.Funakubo, T.Katoda]
通讯作者:
T.Katoda
DOI:
10.1063/1.2337391
发表时间:
2006-09
期刊:
Journal of Applied Physics
影响因子:
3.2
作者:
[S. Yokoyama;S. Okamoto;H. Funakubo;T. Iijima;K. Saito;H. Okino;Takashi Yamamoto;K. Nishida]
通讯作者:
S. Yokoyama;S. Okamoto;H. Funakubo;T. Iijima;K. Saito;H. Okino;Takashi Yamamoto;K. Nishida
Raman Spectroscopic Characterization of Tetragonal PbZrxTil-xO3 Thin Films : A Rapid Evaluation Method for c-Domain Volume,
四方 PbZrxTil-xO3 薄膜的拉曼光谱表征:c 域体积的快速评估方法,
DOI:
--
发表时间:
2005
期刊:
Jpn.J.Appl.Phys., 44(25)
影响因子:
--
作者:
[Ken Nishida, Minoru Osada, Syunsyuke Wada, Shoji Okamoto, Risako Ueno, Hiroshi Funakubo, Takashi Katoda]
通讯作者:
Takashi Katoda
Electric-Field-Induced Displacements in Pt/PZT/Pt/SiO_2/Si System Investigated by Finite Element Method : Material-Constant Dependences
通过有限元方法研究 Pt/PZT/Pt/SiO_2/Si 系统中电场引起的位移:材料常数依赖性
DOI:
--
发表时间:
2006
期刊:
Mater. Res. Soc. Symp. Proc. 902E
影响因子:
--
作者:
[H.Okino, M.Hayashi, T.Iijima, S.Yokoyama, H.Funakubo, N.Setter, T.Yamamoto]
通讯作者:
T.Yamamoto
Strong Dependence on Thickness of Room-Temperature Dielectric Constant of (100)-Oriented Pb(Mg_<1/2>Nb_<2/3>)O_3 Epitaxial Films Grown by Metal Organic Chemical Vapor Deposition
金属有机化学气相沉积法生长的(100)取向Pb(Mg_<1/2>Nb_<2/3>)O_3外延膜的室温介电常数对厚度的强依赖性
DOI:
--
发表时间:
2006
期刊:
Jpn.J.Appl.Phys. 45(40)
影响因子:
--
作者:
[Satoshi Okamoto, Shintaro Yokoyama, Shoji Okamoto, Keisuke Saito, Hiroshi Uchida, Seiichiro Koda, Hiroshi Funakubo]
通讯作者:
Hiroshi Funakubo
共 25 条
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Effects of strain and temperature on dielectric properties of "size effect free" dielectrics
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Preparation of high density memory storage using layer perovskite ferroelectric thin films having nano structure.
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负责人:FUNAKUBO Hiroshi
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依托单位:
海外基金