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Development of Self-Repair Dependable system on FPGA

Development of Self-Repair Dependable system on FPGA
FPGA上自修复可靠系统的开发
批准号:
22300018
负责人:
SUEYOSHI Toshinori
金额:
$11.81万
依托单位:
依托单位国家:
日本
项目类别:
Grant-in-Aid for Scientific Research (B)
财政年份:
2010
资助国家:
日本
项目状态:
已结题
起止时间:
2010 至 2012

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中文摘要
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英文摘要
SRAM-based field programmable gate arrays (FPGAs) are vulnerableto a soft-errors and physical hard-errors. In order to overcome this issues, our goalis the development of self-repair dependable system on FPGA using following three factors.First, we propose the Triple Modular Redundancy (TMR) scheme coupled with the dynamicpartial reconfiguraition to remove SEU from the FPGA’s configuration memory. Second,we propose an evaluation method that provides results in terms of the realistic failurein time (FIT) by using reconfiguration-based fault-injection analysis. By using theproposed method, we successfully evaluated a TMR circuit and could discuss the resultin terms of realistic FIT data. Finally, a uniforming design technique for PRRs(PartialReconfigurable Regions) are introduced in order to relocate their PRB(PartialReconfigurable Block). Additionally, our design technique enables to implement largepartial module by combining neighboring PRRs.
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Improving the Soft-error Tolerability ofa Soft-core Processor on an FPGA usingTriple Modular Redundancy and PartialReconfiguration
使用三重模块化冗余和部分重配置提高 FPGA 上软核处理器的软错误容忍度
DOI: --
发表时间: 2011
期刊: Journal of Next Generation InformationTechnology
影响因子: --
作者: [Y.Ichinomiya, M.Amagasaki, M.Iida,M.Kuga and T.Sueyoshi]
通讯作者: M.Iida,M.Kuga and T.Sueyoshi
DOI: 10.1109/les.2011.2167213
发表时间: 2011-09
期刊: IEEE Embedded Systems Letters
影响因子: 1.6
作者: [Qian Zhao;Y. Ichinomiya;Motoki Amagasaki;M. Iida;T. Sueyoshi]
通讯作者: Qian Zhao;Y. Ichinomiya;Motoki Amagasaki;M. Iida;T. Sueyoshi
Improving the Reliability of FPGA system by using TMR and Partial Rconfiguration
利用TMR和Partial Rconfiguration提高FPGA系统的可靠性
DOI: --
发表时间: 2010
期刊: Proc.International Workshop on Highly Efficient Accelerators and Reconfigurable Technologies
影响因子: --
作者: [Y.Ichinomiya, M.Amagasaki, M.Iida, M.Kuga, T.Sueyoshi]
通讯作者: T.Sueyoshi
A Less Configuration Memory Reconfigurable Logic Device with Error Detect and Correct Circuit
一种具有错误检测和校正电路的少配置存储器可重构逻辑器件
DOI: --
发表时间: 2010
期刊: Proc.of IEEE Region 10 International Technical Conference
影响因子: --
作者: [Q.Zhao, Y.Ichinomiya, Y.Okamoto, M.Amagasaki, M.Iida, T.Sueyoshi]
通讯作者: T.Sueyoshi
37
    Research for Reconfigurable System Technology using Fine Grained Cell Architecture
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      17300021
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      Grant-in-Aid for Scientific Research (B)
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      $10.08万
    • 财政年份:
      2005
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    • 依托单位:
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      11490028
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