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Vertical, strained 1 D silicon Nanostructures and Devices

Vertical, strained 1 D silicon Nanostructures and Devices
垂直应变一维硅纳米结构和器件
批准号:
5439632
负责人:
Professorin Dr.-Ing. Silke Christiansen
金额:
$0.0万
依托单位国家:
德国
项目类别:
Research Grants
财政年份:
2005
资助国家:
德国
项目状态:
已结题
起止时间:
2004-12-31 至 2008-12-31

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中文摘要
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英文摘要
The chemical synthesis of 1D silicon nanostructures has provided a new route to manufacture vertical semiconducting nanostructures with precision on the atomic scale. A major problem inhibiting the utilization of these structures and limiting the investigation of their fundamental electronic and mechanical properties is finding a way to incorporate them into circuits. Elucidating 'Vertical strained 1D silicon Nanostructures and Devices' is a complex task, which requires an interdisciplinary consortium capable of addressing all relevant issues from metal nanoparticle template formation to controlled growth of 1D silicon nanostructures and their analysis in terms of mechanical and electrical properties as well as device integration issues. In this proposal we suggest therefore a transnational cooperation between the Max-Planck-Institute of Microstructure Physics (MPI), Halle (D), the Institute of Solid State Physics (IFK), Jena (D), the Institute for Solid State Electronics (FKE), Technical University of Vienna (A), the Materials Measurement Research Group at the 'Eidgenössische Materialprüfanstalt' (EMPA), Thun (CH) and the Nanostructure Research Group at the Ecole Polytechnique Federale de Lausanne (EPFL) in Lausanne (CH). While the EPFL and the FKE are responsible for providing ordered nanotemplates, the task of IFK, MPI and EPFL is to cover different aspects of controlled growth of 1D nanostructures on these templates. The EMPA is responsible for the electrical and mechanical characterization of individual 1D nanostructures. MPI and EMPA will carry out structural investigations down to the atomic scale. Using advanced wafer bonding at MPI the integration of nanowires in nano-electronic devices will be attempted while the actual devices will be manufactured at FKE
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Defect and interfacial characterization of SiC wafers, structures and devices based on electron microscope techniques
  • 批准号:
    5368708
  • 项目类别:
    Research Units
  • 资助金额:
    $0.0万
  • 财政年份:
    2002
  • 负责人:
    Professorin Dr.-Ing. Silke Christiansen
  • 依托单位:
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国内基金
海外基金
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  • 批准号:
    60776018
  • 项目类别:
    面上项目
  • 资助金额:
    34.0万元
  • 批准年份:
    2007
  • 负责人:
    张轩雄
  • 依托单位: