Novel High Thermal Conductivity Substrates for GaN Electronics: Thermal Innovation
Novel High Thermal Conductivity Substrates for GaN Electronics: Thermal Innovation
批准号:
EP/K024345/1
负责人:
Martin Kuball
金额:
$50.1万
依托单位:
依托单位国家:
英国
项目类别:
Research Grant
财政年份:
2013
资助国家:
英国
项目状态:
已结题
起止时间:
2013 至 --
中文摘要
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英文摘要
AlGaN/GaN high electron mobility transistors (HEMT) are a key enabling technology for future power conditioning applications in the low carbon economy, and for high efficiency military and civilian, microwave and RF systems. Although the performance of AlGaN/GaN HEMTs presently reaches RF powers up to 40W/mm, at frequencies exceeding 300 GHz, their long-term reliability, often thermally limited, is still a serious issue, in the UK & Europe, but also in the USA & Japan. Corresponding challenges exist for power conditioning applications. To mitigate the present thermal device challenges, the aim of this proposal is innovation and step change in thermal management of AlGaN/GaN HEMT devices by developing novel substrates, in particular (1) high value substrates that have higher heat extraction capability than high cost SiC substrates commonly used for GaN RF applications, and (2) low cost substrates that have improved heat extraction capability to GaN-on-Si substrates for more cost sensitive power electronics markets. The resulting step-change in improvement in heat spreading will improve reliability, circuit efficiency and ease system constraints of GaN electronics. To enable the optimization of the thermal substrate properties key enabling new thermal analysis technologies will be developed. The UK has roadmaps for employing RF and microwave GaN electronics in defence as well as satellite communication. The key UK industrial players in this field include Selex, MBDA, Astrium & others, all requiring reliable and efficient GaN RF and microwave electronics, which the proposed work will advance and enable via the new heat extracting substrate technologies and improved methods of thermal characterisation, furthermore with opportunities for IQE UK, supporter of this proposal, of being a key component in the supply chain for RF GaN applications. The corresponding roadmap for power electronics requires cost-effective GaN presently on Si substrates power devices with UK based manufacture at NXP, supporter of this project, and International Rectifier (IR) which the outcome of this proposed work can innovate. Further business opportunities will emerge with the substrate development itself, such as via Element-6, at IQE through the developments of III-Nitride epitaxial growth for best heat extraction, or spin-out companies. Dissemination of results and insights from this project will be via publications in internationally leading journals, via conferences, via the UK Nitrides Consortium, i.e., established dissemination routes will be used to transfer knowledge into academia, and directly with the industrial supporters of this project, as well as other companies Bristol and Bath have links to (e.g. Selex, MBDA). The CDTR in Bristol and the III-Nitride group in Bath have both a strong track record in being successful using these dissemination routes, in particular with companies. The field of thermal management of semiconductor devices is an important academic research field, and is especially topical and useful at the current stage of implementation of this genuinely disruptive technology. It not only trains UK workforce for industry, but also it is essential to help maintain the present high level of device physics and engineering in the UK. It provides stimulus for an efficient interaction between universities and industry to maximize benefit of EPSRC research investment. This includes in this project interaction with UK industry, in particular, IQE, NXP, and Plessey in this project.
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DOI:
10.1109/led.2016.2537835
发表时间:
2016-04
期刊:
IEEE Electron Device Letters
影响因子:
4.9
作者:
[Huarui Sun;J. Pomeroy;Roland B. Simon;D. Francis;F. Faili;D. Twitchen;Martin Kuball]
通讯作者:
Huarui Sun;J. Pomeroy;Roland B. Simon;D. Francis;F. Faili;D. Twitchen;Martin Kuball
AlGaN/GaN field effect transistors for power electronics-Effect of finite GaN layer thickness on thermal characteristics
电力电子用 AlGaN/GaN 场效应晶体管 - 有限 GaN 层厚度对热特性的影响
DOI:
10.1063/1.4831688
发表时间:
2013
期刊:
Applied Physics Letters
影响因子:
4
作者:
[Hodges C]
通讯作者:
Hodges C
DOI:
10.1109/led.2014.2350075
发表时间:
2014-09
期刊:
IEEE Electron Device Letters
影响因子:
4.9
作者:
[J. Pomeroy;Roland B. Simon;Huarui Sun;D. Francis;F. Faili;D. Twitchen;Martin Kuball]
通讯作者:
J. Pomeroy;Roland B. Simon;Huarui Sun;D. Francis;F. Faili;D. Twitchen;Martin Kuball
DOI:
10.1038/ncomms15942
发表时间:
2017-06-30
期刊:
Nature communications
影响因子:
16.6
作者:
[Liu D, Gludovatz B, Barnard HS, Kuball M, Ritchie RO]
通讯作者:
Ritchie RO
Implications of gate-edge electric field in AlGaN/GaN high electron mobility transistors during OFF-state degradation
AlGaN/GaN 高电子迁移率晶体管关态退化期间栅极边缘电场的影响
DOI:
10.1016/j.microrel.2014.09.020
发表时间:
2014
期刊:
Microelectronics Reliability
影响因子:
1.6
作者:
[Sun H]
通讯作者:
Sun H
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