Aging and Reliability Effects Modelling and Mitigation in Nanoelectronics and Sensors

纳米电子学和传感器中的老化和可靠性影响建模和缓解

• 批准号: RGPIN-2019-04016
• 负责人: Ivanov, Andre
• 金额: $ 2.04万
• 依托单位: University of British Columbia
• 依托单位国家: 加拿大
• 项目类别: Discovery Grants Program - Individual
• 财政年份: 2020
• 资助国家: 加拿大
• 起止时间: 2020-01-01 至 2021-12-31
• 项目状态: 已结题
• 来源: https://www.nserc-crsng.gc.ca/ase-oro/Details-Detailles_eng.asp?id=712805
• 关键词: Aging; Reliability; Effects; Modelling; Mitigation

Micro- and nano-electronic devices (transistors h devices is their increased susceptibility to aging, namely to demonstrate a noticeable degradation in performance and/or functionality over time. One demonstration of transistor aging is the shifting of the voltage at which a transistor turns on or off. Over time this leads such transistors to become slower to the point of failing to function altogether and thereby leading to system failure. While possibly tolerable common consumer products, such degradation will not be tolerable in systems and applications with requirements set for high-performance and/or high safety-criticality for extensive periods of time, e.g., automotive sector. My recent research has investigated some fundamental phenomena related to aging in semiconductor materials. The proposed work will extend this work by focusing on establishing fundamental knowledge and characterization of the mechanisms that cause transistor and sensor degradations over time. The focus will be on the most common technologies like Complementary Metal Oxide Semiconductor (CMOS) as well on other emerging technologies such as Cadmium Zinc Telluride (CZT) used in novel radiation detectors with applications in medical imaging, security (bomb detection) and surveillance. The proposed research program will also aim at developing solutions that eliminate altogether or mitigate the causes for degradation over time. This work will therefore aim at developing solutions that will allow the deployment of future high performance and/or highly reliable compute, communication and sensor systems and networks. The work will involve the development of sophisticated numerical modelling techniques and will lead to novel device fabrication, circuit, and system design methodologies that take into account or circumvent aging mechanisms, and involve graduates (6) and undergraduates (3) who will become highly qualified and employable by Canadian industry and able to contribute to future R&D in industrial or academic environments. The work will contribute to the worldwide semiconductor R&D community focused on electronic device reliability challenges. The work will be of direct and indirect importance and interest to a myriad of organizations established in Canada and focused on current or emerging computing, communications and sensing technologies. These include MDA, Huawei, IBM, Amazon, Google, Microsemi, D-Wave, Canadian Space Agency, Redlen Technologies, and others.

微型和纳米电子设备（晶体管H设备是它们增加对衰老的敏感性的增加，即表明随着时间的推移的性能和/或功能在性能和/或功能上的明显退化。晶体管衰老的一个证明是伏特的转移是跨时间的转变，因此，跨时间会导致跨度的失败。在系统和应用中，这种降解可能无法忍受，在很长的一段时间内，将无法忍受高性能和/或高安全性批判性的要求，例如汽车领域。 我最近的研究调查了与半导体材料衰老有关的一些基本现象。拟议的工作将通过专注于建立基本知识和对导致晶体管和传感器降解的机制的基本知识和表征来扩展这项工作。重点将放在最常见的技术上，例如互补的金属氧化物半导体（CMOS）以及其他新兴技术，例如在新型辐射探测器中使用的新兴技术，例如在医学成像，安全成像（炸弹检测）和监管中应用的新型辐射探测器。拟议的研究计划还将旨在开发解决方案，以完全消除或减轻随着时间的推移降解的原因。 因此，这项工作将旨在开发解决方案，以使未来的高性能和/或高度可靠的计算，通信和传感器系统和网络部署。 这项工作将涉及复杂的数值建模技术的开发，并将导致新颖的设备制造，电路和系统设计方法论，这些方法考虑或规避了老化机制，并涉及毕业生（6）和本科生（3）（3），他们将成为加拿大行业高度合格和可用的，并能够在加拿大的RED和INDECTIONALICAMENT中贡献。 这项工作将有助于全球半导体研发社区，重点是电子设备可靠性挑战。 这项工作将对在加拿大建立的无数组织具有直接和间接的重要性和利益，并侧重于当前或新兴的计算，通信和传感技术。 其中包括MDA，华为，IBM，Amazon，Google，Microsemi，D-Wave，加拿大航天局，Redlen Technologies等。